Main Program

Main Program
2015
GENERAL CHAIR’S MESSAGE
“Unleash the Power of R&M Knowledge
and Advance the R&M Industry”
Keith Janasak
It is my pleasure to welcome you to the 61st Reliability And Maintainability Symposium. The objective of this unique
symposium is to exchange knowledge rather than just preserve it in technical papers. That objective is the genesis of this
year’s RAMS® theme, “Unleash the Power of R&M Knowledge and Advance the R&M Industry.”
Regardless of what type organization you work for, the retention, management, and effective utilization of our RAM
knowledge is fast becoming a challenge. Our universities are helping prepare our future RAM engineering personnel, but
the ability to pass along an organization’s legacy knowledge is critical to the success of our industry. To address this challenge, RAMS® 2015 delivers a breadth of relevant topics, from RAM technology research and development, to practical
implementation, to knowledge management of RAM principles and knowledge.
We are very pleased to have as our Keynote Speaker Mr. Jeff Babione, Vice President and Deputy General Manager of the
F-35 Lightning II Program at Lockheed Martin Aeronautics Company. Mr. Babione will discuss how RAM knowledge
has been instrumental to implementing innovative solutions to challenges associated with the F-25’s cutting-edge technologies. Our Banquet Speaker is Mr. James Wasiloff, Director of Transformation & Continuous Process Improvement
for the U.S. Army TACOM. He will discuss the challenges that the driverless car presents from a consumer acceptance
perspective as well as a hardware and software reliability perspective.
Let us know how you enjoy the new features we have added this year, such as the Chairman’s Corner ─ an informal 15
minute session each morning to help you plan your day while enjoying a continental breakfast, and a free RAMS® 2015
App for iOS, Android and Windows platforms.
The beautiful Innisbrook Golf & Resort Club offers a flexible, campus style venue. Free on-call shuttles are available to
help you get around quickly, whether you’re attending a RAMS® session or taking advantage of the Spa & Fitness Center,
one of the five restaurants, six swimming pools, eleven tennis courts, or four championship golf courses.
We believe RAMS® 2015 will once again provide you with a great value and opportunity to network with your peers and
Unleash Your R&M Knowledge.
Keith Janasak is the Whole Life Engineering Technology & Process Manager,
Space & Airborne Systems organization at Raytheon Corporation.
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2015
Registration and Information at the RAMS® Registration Desk at Stirling West Ballroom
RAMS® Exhibition
Every exhibitor has been carefully selected with improved reliability, maintainability, quality and productivity in mind. All exhibits will be in the Stirling
Ballroom East, see map on page 31. Coffee breaks will be held in the exhibit area. The Exhibition is a valuable component of the Symposium as it provides information on products and services which can help you do your job more efficiently. Even if you plan to attend every technical session, there will still be plenty
of time to visit the exhibits between sessions and during lunch breaks. The Exhibition is scheduled to be open at the following times:
Monday, January 26, 2015 Tuesday, January 27, 2015 Wednesday, January 28, 2015 Thursday, January 29, 2015 Exhibitor List
5:00pm - 7:00pm
9:00am - 5:00pm
9:00am - 5:00pm
9:00am - 1:00pm
ALD Ltd.
BQR Reliability Engineering, LTD
Cincinnati Sub Zero
Controls and Data Services
Defense Systems Information Analysis Center
DfRSoft
Fulton Findings, LLC
HCRQ, Inc.
Isograph Inc.
Item Software
Minitab Inc.
PTC
Ops A La Carte, LLC
Qualmark Corp.
ReliaSoft Corp
SAS/JMP
Satodev S.A.S.
Softrel LLC
The Omnicon Group
UE Systems Inc.
University of Arkansas
University of Maryland
WPI Services, LLC.
Poster Sessions and iPad Raffle
This year, we will again hold Poster Sessions for papers that have been exclusively selected to be presented based on content and expected level of
one-on-one interaction with attendees and R&M experts. These sessions also include the papers from authors with multiple accepted papers. These
sessions enable RAMS® 2015 attendees to get in-depth detail on the topics presented, and to interact with subject matter experts directly. Due to the
increasing popularity of Poster Sessions at previous RAMS®, the papers that are presented in regular technical oral sessions will be given the opportunity to present once again in a Poster Session. However, due to limited slots at the Poster Sessions, open slots will be filled on a first-come-first-served
basis; oral session authors can contact their Program Vice-Chair if they want to present. (See page 4, Program Matrix, for Poster Session times and
locations.) Food and drinks will be served. Three Apple iPad Air 2s (16 GB) will be raffled off. One raffle ticket may be obtained at the end of each of
the Thursday sessions (maximum of two tickets). Attendees must be present to win. For more information contact Suprasad Amari or David Fernald.
Job Posting Board
RAMS® is again sponsoring a job posting board for openings in the assurance disciplines. Any business interested in describing its employment opportunities
to the world’s premier gathering of assurance professionals is encouraged to post directly on the bulletin boards, which will be available to all Symposium attendees. This is an extraordinary opportunity to get your employment message out as well as a unique resource for job seekers.
IEEE Continuing Education Units (CEUs)
You can earn CEUs by attending our Tutorials and Workshops at no extra charge (0.1 CEU per hour). Simply use a CEU completion form included with your
registration packet. Complete the form according to the instructions, and return it to the registration desk at the conclusion of the Symposium. Your CEU certificate will be e-mailed to you.
ASQ Certification Exams at RAMS®
ASQ Certified Reliability Engineering (CRE), Six Sigma Black Belt (SSBB) and Six Sigma Green Belt (SSGB) Examinations
Special arrangements have been made with ASQ to offer ASQ Certified Reliability Engineer (CRE), Certified Six Sigma Black Belt (CSSBB) and Certified Six
Sigma Green Belt (CSSGB) examinations on Thursday, January 29, 2015, from 8:00 – noon. For more information and advance registration, visit ASQ Exams
at RAMS 2015 Website, http://asq.org/cert/resource/docs/2015/2015%20RAMS%2001-29-15.pdf. Walk in registration for the CRE and SSGB examinations
will be permitted up to noon, Wednesday January 28, 2015 on a space available basis. For more information about ASQ Certifications, visit ASQ’s Certification
Website, http://asq.org/cert/control/index. The exams are open book and any silent, hand-held, battery-operated calculator without an alphabetic keyboard will
be permitted. A picture ID is required for admittance.
RAMS® Tutorial Certificate
You can enroll in the two-level RAMS® Tutorial Certificate Program at the Registration Area. The first level requires that you attend five core concept tutorials;
the second level requires an additional 10 tutorials based on your own professional needs and interests, taken across at least two Symposia. Due to the timeliness of the material, the Certificate Program must be completed within four years of the first core tutorial. Upon completion of the program, you will receive a
RAMS® certificate, a letter of completion and a list of tutorials attended.
Spouses’ Hospitality Suite
A RAMS® Conference Spouses’ Hospitality Suite will be open Monday through Wednesday, 7 am to 5 pm, location: Edinburgh Hall 3-4. Continental breakfast
will be served at 8 am each day. The Hotel Concierge will be available from 8 am to 9 am daily to assist you with any special requests. There is also a guided
tour from 3-4 PM on Monday (meeting in the Edinburgh foyer). For information please contact Om Yadav via e mail at [email protected]
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RAMS® 2015 PROGRAM MATRIX
#
A
B
C
D
E
Stirling O-P-Q
Stirling L-M-N
Stirling I-J-K
Stirling D-E-F
Stirling G-H
10:15 - 12:15
1
13:30 - 15:30
2
15:45 - 17:45
3
Software Reliability
Introduction to Reliability
System Reliability Models
Techniques and
Physics and Physics of
An Introduction to
(PS)
Applications (PS)
Failure Methods (T)
Probability Models in
Reliability and
Maintainability (R&M) (T)
Techniques for
Condition Based
Physical Failure Modeling
10:15A - 15:30P
Repairable Systems
Maintenance: Theory and
& Applications I (PS)
Management (PS)
Methodology (T)
Intro to R&M
Management (T)
Accelerated Life Testing
Application in Lean
Product Development (T)
Managing Critical R&M
Knowledge (PN)
Applied R&M
Accelerated Life Testing
R&M Management Under
Management for Industry
Models (PS)
New Challenges I (PS)
Solutions (PS)
Discrete Event Modeling
Applied to Design
Optimizing R&M Cost and
Reliability Testing (PS)
Optimization in Different
Performance (PS)
Industries (PN)
5
10:15 - 12:15
6
13:30 - 15:30
7
Introduction to Fault Tree
Analysis (T)
15:45 - 17:45
8
Understanding & Applying How to Give Outstanding Development & Training
Needs for Reliability
Reliability Presentations
the Fundamentals of
Engineers (PN)
(T)
FMEA (T)
Introduction to Life Data
Analysis (T)
8:00A - 12:15P
18:00 - 20:00
Determining the Right
Sample Sizes for your
Test: Theory and
Application (T)
Overview of Functional
Safety Concepts & the
IEC 61508 Standard (T)
Advances in Life Data
Analysis (PS)
R&M Applications in
Aerospace (PS)
Reliability Modeling
Techniques I (PS)
System Safety and Risk
Analysis (PS)
Accelerated Degradation
and Life Testing (PS)
Tuesday
January 27
Dynamic Approaches to
Risk and Reliability (T)
8:00 - 10:00
Poster Session #1 & Reception - Location: Edinburgh Ballroom West
9
Risk Management
Principles and
Techniques (T)
10:15 - 12:15 10
How to Customize a
PFMEA Based on
Accelerated Life Testing
Reliability Modeling
Manufacturing Processes
Applications (PS)
Techniques II (PS)
(T)
Advisory Board Panel - Location: Edinburgh Ballroom East
13:30 - 15:30 11
An Introduction to
Optimization Methods in
Quantification of Burn-In
Reliability and
& Environmental Stress
Maintainability (T)
Screening (ESS) (T)
15:45 - 17:45 12
Practical Approaches for
Reliability Evaluation
Using Degradation Data
(T)
18:30 - 21:30
Electronic Part Failure
Analysis Tools and
Techniques (T)
Reliability: The Next
Frontier in Safe Patient
Care (PN)
R&M Applications in
Manufacturing (PS)
Statistical Methods for
R&M (PS)
Strategies for Risk
Physical Failure Modeling
Avoidance Using FMEA
& Applications II (PS)
(PS)
Risk Informed Decision
Making (PS)
Prognostics and Health
Management II (PS)
Wednesday
January 28
Chairman's Corner - Location: Stirling Ballroom West
7:45 - 8:00
General Reception & Banquet - Location: Inverness Foyer & Ballroom
Chairman's Corner - Location: Stirling Ballroom West
7:45 - 8:00
Interpretable Pattern
Experiences in Reliability Based Machine Learning
13
Data Analysis (T)
for Condition-Based
Maintenance (T)
10:15 - 12:15 14
Engineering Availability in
Systems of Systems (T)
FTA vs. RB – Differences
and Similarities for
System Modeling (T)
Business Intelligence in
Reliability (PS)
Network Modeling and
Analysis (PS)
R&M Applications in
Service (PS)
R&M Management Under
New Challenges II (PS)
Poster Session #2 - Location: Edinburgh Ballroom West
12:15 - 14:15
4
R&M Applications in
Safety Critical Systems
(PS)
Chairman's Corner - Location: Stirling Ballroom West
7:45 - 8:00
8:00 - 10:00
Prognostics and Health
Management I (PS)
Maintenance Planning
(PS)
Monday
January 26
General Chair's Welcome & Keynote - Location: Edinburgh Ballroom
8:30 - 10:00
8:00 - 10:00
Date
Legend
(T) = Tutorial
(PN) = panel
(PS) = Paper Session
Thursday
January 29
Time
2015
KEYNOTE SPEAKER
Mr. Jeff Babione
Abstract
Mr. Jeff Babione is Vice President and Deputy General Manager of the F-35 Lightning II Program at Lockheed
Martin Aeronautics Company. Mr. Babione supports all areas of the F-35 Lightning II fighter aircraft program,
to ensure successful completion of System Development and Demonstration, transition to production, global
deployment and sustainment of the F-35 for 13 military services in nine partner countries. The F-35 incorporates
many leading edge technologies which have resulted in several new and challenging opportunities from a reliability
and maintainability perspective. Mr. Babione will discuss how R&M knowledge has been instrumental to
implementing several innovative solutions to these challenges.
Biography
Prior to his current position, Mr. Babione served as Vice President and General Manager, F-16/F-22 Integrated
Fighter Group, where he led all aspects of the development, manufacture and sustainment of the F-16 Fighting
Falcon and the F-22 Raptor. He was responsible for program performance and identifying synergies across both
fighter programs, aligning them for continued success.
A Lockheed Martin employee for more than 20 years, he has held a wide range of engineering and leadership
positions, including F-22 Chief Engineer from 2006 to 2010. As Chief Engineer, he was responsible for overall
technical integrity of the world’s first 5th Generation Fighter program. Lockheed Martin and the Raptor Team were
awarded the Robert J. Collier Trophy for the most significant achievement in American aerospace in 2006.
He began his career with the Boeing Company in Seattle, Washington. His work there included advanced composite
development, structural design analysis and testing of large commercial airliners as well as the YF-22 prototype.
Mr. Babione holds a bachelor’s degree in Aerospace and Ocean Engineering from Virginia Tech, a master’s degree in
Aerospace Engineering from the University of Washington, and an MBA from the University of Tennessee.
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TUTORIALS, SESSIONS, WORKSHOPS
MONDAY JANUARY 26 SCHEDULE
General Chair’s Welcome and Keynote
Monday 8:30 AM - 10:00 AM
Edinburgh Ballroom
General Chair: Keith Janasak, Raytheon Company, (United States)
Keynote Speaker: Jeff Babione, Lockheed Martin Company (United States)
Tutorial 01A/02A (Core): An Introduction to Probability Models in Reliability & Maintainability
Monday 10:15 AM - 12:15 PM, 1:30 PM - 3:30 PM
Stirling O-P-Q
Tutorial 01B:
Monday 10:15 AM - 12:15 PM
Introduction to Reliability Physics and Physics of Failure Methods
Stirling L-M-N
Session 01C:
Monday 10:15 AM - 12:15 PM
Software Reliability Techniques and Applications
Kellie Schneider, University of Dayton (United States), Richard Cassady, University of Arkansas (United States)
This tutorial covers the traditional, fundamental probability models used to describe, improve, and optimize system reliability and maintainability.
The purpose of this tutorial is to provide attendees with basic coverage of the traditional, fundamental probability models used to describe, improve, and
optimize system reliability and maintainability. This coverage requires the discussion of some basic concepts from probability and distribution theory.
No specific models are endorsed. Instead, emphasis is placed on identifying the key assumptions associated with each model.
James McLeish, DfR Solutions, Dock Brown, DfR Solutions (United States)
This tutorial provides an introduction to Reliability Physics and Physics of Failure methods for designing Quality, Reliability and Durability into products and systems.
Stirling I-J-K
Moderator: Lori Bechtold, Boeing (United States)
Vice Chair: Dmitry Tananko, General Dynamics Land System (United States)
This session covers all aspects of Software Reliability and its applications, including the discussion on Software Reliability Standard and Handbook.
01C1 IEEE 1633 – Standard for Recommended Practice on Software Reliability
Lance Fiondella, University of Massachusetts Dartmouth (United States), Ann Marie Neufelder, SoftRel, LLC (United States),
Louis Gullo, Raytheon Company (United States), Taz Daughtrey, Cyber Security Information Analysis Center (United States)
Software reliability is a fundamental prerequisite for virtually all modern engineered systems that rely on software to manage complex electronic and
electro-mechanical systems. This paper discusses the enhancements being made to the IEEE 1633 Standard, Recommended Practice on Software Reliability, which are representative of current practices and will improve the accessibility of the document to a broader audience
01C2
Early Modeling of Software Reliability Growth and Its Projected Reliability
Milena Krasich, Raytheon Company (United States)
Systematic software fault removal is modeled by Raytheon Krasich-Peterson Early Stage Reliability Growth Projection Model, which is the only known
early SW model of this type.
Reliability vibration tests in automotive
01C3
Marco Bonato, Valeo (France), David Delaux, Valeo (France)
Reliability fatigue design of engine cooling components: synthesis and experimental validation of accelerated vibratory durability tests.
01C4
Innovative Methodology for Reliability Evaluations of Software Systems
Megan Jais, U.S. Army Test and Evaluation Command (United States)
This paper will discuss innovative methodologies for defining reliability evaluations of Major Automated Information Systems (MAIS) programs,
including the use of metrics such as server reliability versus end user experience, identifying the system “under test,” and the use of additional metrics to
provide a meaningful software reliability evaluation to decision makers.
Session 01D:
Monday 10:15 AM - 12:15 AM
System Reliability Models
Stirling D-E-F
Moderator: Ruiying Li, Beihang University (China)
Vice Chair: Tngdan Jin, Texas State University (United States)
This session invetigates new models and techniques to estimate the reliability of complex systems considering cold standby components, dependent
failures, multi-state degradation, and interface failures.
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2015
01D1
Reliability Analysis of Multi-state Systems with S-dependent Component
01D2
System Reliability Assessment Incorporating Interface Failure
01D3
Reliability analysis of cold standby systems with scheduled backups
01D4
Modeling and analysis of dependable systems through GCTBN models
Cuong Dao, University of Alberta (Canada), Ming Zuo, University of Alberta (Canada)
This paper presents a model of multi-state system with multi-state dependent components and analyzes the system reliability using a modified universal
generating function and Monte Carlo simulation methods.
Zhaojun Li, Western New England University (United States), Mohammadsadegh Mobin, Western New England University (United States)
This paper proposes a new perspective and method to model system reliability by incorporating both functional and interface/interaction failure analysis.
The method is demonstrated through the reliability analysis of a power assembly of a diesel-electric engine development.
Qingqing Zhai, Beihang University (China), Liudong Xing, UMass Dartmouth (United States)
Rui Peng, University of Science & Technology Beijing (China), Jun Yang, Beihang University (China)
We study a 1-out-of-n cold standby system subject to scheduled backups and propose a multi-valued decision diagram based approach to evaluate the
system reliability.
Luigi Portinale, University of Piemonte Orientale (Italy), Daniele Codetta-Raiteri, University of Piemonte Orientale (Italy)
The paper proposes the formalism of Generalized Continuous Time Bayesian Network as a language for modeling and analysis of dependable systems.
Tutorial 02B:
Monday 1:30PM - 3:30 PM
Condition-Based Maintenance: Theory and Methodology Session 02C:
Monday 1:30PM - 3:30 PM
Physical Failure Modeling and Applications I
Stirling L-M-N
Amanda Gillespie, SAIC (United States)
This tutorial presents a history of condition based maintenance (CBM), its tools and techniques and presents a proposed way to both optimize profitability of performance based logistics contracting for industry, and decrease life cycle cost for the government with the utilization of CBM strategies.
Seirling I-J-K
Moderator: Lance Fiondella, UMASS (United States)
Vice Chair: Dmitry Tananko, General Dynamics Land System (United States)
The first session is dedicated to Physical Failure Modeling and the proper applications and examples of such modeling.
02C1
Reliability Test, Characterization and Modeling of Solid State Storage
02C2 Investigation of BEOL Plasma Process Induced Damage on Gate Oxide
02C3 Physics Based Reliability: A Method to Meet Life Cycle Affordability
02C4
The Degradation Model of Servo Valve with Coupled Failure Mechanisms
Jay Sarkar, HGST, Western Digital Corporation (United States), Feng-Bin Sun, HGST, A Western Digital Company (United States)
Reliability Test, Characterization and Modeling of Solid State storage/drives is based on Program/Erase Cycles and Bit Error Rates - and contrasted with
temporal metrics of reliability such as MTTF. Subsystem reliability and margins to failure is also discussed.
Lingxiao Cheng, SMIC (China), ChiHsi Wu (China - Taipei), JungChe Chang, SMIC (China - Taipei), Xiaofeng Xu (United States)
Plasma process induced damage (PID) to thin gate oxide was investigated in this paper with antenna test structures to enhance the effect of plasma
charging. Gate leakage under Fowler-Nordheim (F-N) stress was applied for gate oxide degrading measurement. Contact (CT) etching stop layer and
back end of line process (BEOL), especially high density plasma (HDP) chemical vapor deposition (CVD) of inter-metal-dielectric (IMD) plays the
main role in oxide damage. These phenomena provide important approaches to reduce PID effect in integrated circuit manufacturing.
Patrick Malone, MCR, LLC (United States), Tuan Nguyen, General Atomics Aeronautical (United States)
We address the use of Physics of Failure early in program development to improve the confidence of cost estimates.
Chunbo Yang, IEEE reliability society (China), Shengkui Zeng, Beihang University (China),
Jianbin Guo (China), Jianyu Zhao, IEEE reliability society (China)
The degradation model is established by injecting structural degradation to performance model. The coupled failure mechanisms are wear and clogging,
and interaction is formulated.
Session 02D: Monday 1:30PM - 3:30 PM
Techniques for Repairable Systems Management Stirling D-E-F
Moderator: Lisa M. Maillart, UPitt (United States)
Vice Chair: Troy Schwartz, Life Cycle Engineering (United States)
This session explores novel issues inherent to the modeling, analysis and optimization of repairable systems.
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02D1 Geometric Renewal Process as Repairable System ModeL
02D2 Complexities of System of Systems Operational Availability Modeling
02D3 On the Use of Jump-Diffusion Process for Maintenance Decision-Making
02D4 Repairable Item Inventory Model Optimization with Uncertainty Theory
Vasiliy Krivtsov, Ford Motor Company (United States), Mark Kaminskiy, NASA Goddard Space Flight Center (United States)
A point process model with a monotonically decreasing or increasing ROCOF and the underlying distributions from the location-scale family. The paper
discusses properties and maximum likelihood estimation of the model along with some illustrative case studies.
Dennis Anderson, Sandia National Laboratories (United States), Charles Carter, Sandia National Laboratories (United States)
Tamara Brown, Sandia National Laboratories (United States)
Calculating operational availability (Ao) for a system of systems (SoS) presents unique challenges to reliability, availability, and maintainability analysts. This paper explores some of the complexities involved in SoS Ao modeling and presents SoS simulation results from a modeled SoS application.
Houda Ghamlouch, Institut Charles Delaunay, Université de Technologie de Troyes (France),
Mitra Fouladirad, University of technology of Troyes (France), Antoine Grall, Université de Technologie de Troyes & CNRS UMR SMTR
(France)
This paper explores a first step of using Jump-Diffusion processes for maintenance decision-making considering a log-normal diffusion and log-uniform
jump amplitude stochastic process for data modeling.
Qiao Han, Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering,
Beihang University (China), Meilin Wen, Beihang University (China)
In this spares optimization model based on the Uncertainty Theory, performance index is expressed with uncertain variables considering belief degree
presented mathematically.
Session 02E:
Monday 1:30 PM - 3:30 PM
Maintenance PlanningStirling G-H
Moderator: Jane Krolweski, AEC (Unites States)
Vice Chair: Dave Fernald, ASQ–Electronics & Communications Div. (United States)
This session discusses maintenance costs and resource planning across a number of industries.
02E1
Extraction and Exploitation of R&M Knowledge from a Fleet Perspective
02E2 Modeling Multiple Preventative Maintenance Actions in a RAMS Analysis
02E3 Reliability Centered Maintenance Cost Modeling: Lost Opportunity Cost
02E4
When will spares run out?
Simone Turrin, ABB, Corporate Research (Germany), Subanatarajan Subbiah, ABB Corporate Research (Germany)
The paper presents a new analytical method to extract and exploit reliability and maintainability knowledge on a fleet level. The results of this analysis
can provide valuable feedback to the manufacturer’s R&D department and enable new fleet services.
Jack Olivieri, MITRE Corporation (United States)
This paper describes how multiple preventative maintenance (PM) activities can be modeled in the availability and reliability analyses of complex
systems, using popular off the shelf software. This is a necessary and critical step for an understanding of the downtime implications of certain electromechanical subsystems and systems, but is not always easy to model with some software packages.
Daniel Sillivant, University of Alabama in Huntsville (United States)
The benefits of implementing reliability centered maintenance (RCM) solution by showing the importance of considering the costs associated with the
lost opportunity for the system.
Mark Monaghan, Raytheon Company (United States)
This paper will address and demonstrate the optimal calculation for inventory modeling when the repairable system is in use at multiple locations, with
diverse conditions, and differing cycle times. The prime focus of the paper will be to provide an effective calculation to determine when spares will run
out.
Tutorial 03A:
Monday 3:45 PM - 5:45 PM
Introduction to Reliability and Maintainability Management
Tutorial 03B:
Monday 3:45 PM - 5:45 PM
Applying Accelerated Life Testing in Lean Product Development
Stirling O-P-Q
Fred Schenkelberg, FMS Reliability (United States)
This tutorial provides an outline to guide the management of an effective reliability program that achieves reliability objectives while staying within
budget and time constraints.
Stirling L-M-N
John Paschkewitz, Watlow (United States)
This tutorial provides a summary of lean product development tools and methods to help ensure customer reliability needs are achieved.
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Panel 03C:
Monday 3:45 PM - 5:45 PM
Managing Critical R&M Knowledge
Stirling I-J-K
Moderator: David Oberhettinger, NASA/Caltech Jet Propulsion Laboratory (United States)
Vice Chair: Tongdan Jin, Texas State University (United States)
Panelists:
John English, Dean, College of Engineering, University of Arkansas (United States),
John Gebhard, Rolls Royce Engines (United States),
Andrew N. Monje, Office of the Deputy Assistant Secretary of Defense (United States),
C.W. Plotklin, Ford Motor Company (retired) (United States)
Where we have an aging workforce and inadequate measures to preserve intellectual capital, critical R&M engineering knowledge may effectively be
lost unless active measures are taken to capture, retain, share, and reuse the knowledge recognized as key to company success. The panel will discuss
challenges and successes in retaining key institutional R&M capabilities.
Session 03D:
Monday 3:45 PM - 5:45 PM
Prognostics and Health Management I
Stirling D-E-F
Moderator: Jürgen Herrmann, Siemens (Germany)
Vice Chair: Masoud Pourali, University of Maryland (United States)
The papers in this session show how prognostics and health management (PHM) tools are used to continuously evaluate systems’ health and assure their
operable condition.
03D1 Multi-Branch Hidden Semi-Markov Modeling for RUL prognosis
03D2 System Engineering Approach for Diagnostics of Electromechanical Systems
03D3 Operation and maintenance decision making using prognostic information
Thanh Trung LE, GIPSA-lab, Univ. Grenoble Alpes & CNRS (France),
Christophe Berenguer GIPSA Lab, Univ. Grenoble Alpes & CNRS (France), Florent Chatelain, GIPSA laboratory (France)
This paper proposes a novel multi-branch Hidden semi-Markov Model (MB-HSMM) for diagnostics and prognostics of equipments under multiple
deterioration modes.
Paul Dumont, University of Southern California (United States)
A System Engineering approach for diagnosing and isolating failures in electromechanical systems.
Seyed Niknam, Western New England University (United States), John Kobza, University of Tennessee - Knoxville (United States),
J. Wesley Hines (United States)
This research considers the simultaneous optimization of profit and service life using non-dominated sorting genetic algorithm and degradation-based
prognosis.
03D4 Health-assessment methodology research for SMPS based on simulation
Cen Chen, Harbin Institute of Technology (China), Yixing Wang, Harbin Institute of Technology (China), Yuege Zhou (China),
George Vachtsevanos, Georgia Institute of Technology (United States)
By injecting degradation parameters of components into the highly precise SMPS model, a health assessment methodology for SMPS based on simulation is proposed.
Session 03E:
Monday 3:45 PM - 5:45 PM
R&M Applications in Safety Critical Systems Stirling G-H
Moderator: James Loman, Space System/Loral, LLC (United States)
Vice Chair: John Klohoker, NASA/Caltech Jet Propulsion Laboratory (United States)
This session addresses the practical application of R&M techniques in real-life scenarios.
03E1 Reliability and Probabilistic Risk Assessment - How They Play Together
03E2 Performance-based Aggregation of Expert Opinions for Reliability Prediction of Arctic
Offshore Facilities
Fayssal Safie, NASA (United States), Richard Stutts, NASA (United States), Zhaofeng Huang, Aerojet Rocketdyne (United States)
A description of the differences and similarities between the PRA process and the Reliability Engineering discipline and how they work together.
Masoud Naseri, UiT The Arctic University of Norway (Norway), Yuan Fuqing, UiT The Arctic University of Norway (Norway) ,
Javad Barabady, UiT The Arctic University of Norway (Norway)
Reliability of a system in Arctic offshore facilities, where historical failure data is scarce, is predicted using performance-based aggregation of experts’
judgements.
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03E3 Gas Turbine APU Reliability Modeling and Failure Forecasting
03E4 Replacement Interval Optimization for Aircraft Maintenance
Peng Wang, Pratt & Whitney AeroPower (United States), Shaonian Wang, China Southern Airlines (China),
Lulu Wang, China Southern Airlines (China)
This study develops a quantitative approach to resolving the reliability, repair and service challenges arising from complex repairable systems like gas
turbine APUs.
Zigmund Bluvband, ALD Ltd. (Israel), Sergey Porotsky, ALD Ltd. (Israel),
Yang Lin, Shanghai Aircraft Design & Research Institute (SADRI) (China)
Two approaches of the optimization of the Preventive Maintenance based on available data for system elements are described and compared: (1) Traditional statistical approach, based on the reliability characteristics of the population of items, and (2) PHM approach, based on measureable parameters of
the individual items.
TUESDAY JANUARY 27 SCHEDULE
Chairman’s Corner Stirling Ballroom West
Tuesday 7:45 AM - 8:00 AM
General Chair: Keith Janasak, Raytheon Company (United States)
Tutorial 05A/06A (Core): Introduction to Life Data Analysis
Tuesday 8:00 AM - 10:00 AM, 10:15 AM - 12:15 PM
Stirling O-P-Q
Tutorial 05B:
Tuesday 8:00 AM - 10:00 AM
Dynamic Approaches to Risk and Reliability
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Session 05C:
Tuesday 8:00 AM - 10:00 AM
Accelerated Life Testing Models
Larry Leemis, Department of Mathematics, The College of William & Mary (United States)
This tutorial introduces the key concepts and techniques commonly used in the statistical analysis of reliability, maintainability, and supportability data.
.
Vitali Volovoi, Consultant (United States)
This tutorial provides an overview of current state of the art in system risk, reliability, and maintenance modeling using dynamic methods.
It provides an overview of current state of the art in system risk, reliability, and maintenance modeling using dynamic methods.
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Moderator: Feng-Bin Sun, HGST, A Western Digital Company (United States), Hitachi GST (United States)
Vice Chair: Wendai Wang, Thoratec Corporation (United States)
Accelerated life testing (ALT) methods have been around for a while, but improvements have been made and this session provides novel ALT models
and their applications.
05C1 Usage Based Predictive Transistor Aging Model to Optimize Test Limits on IO Circuits
05C2
An Updated Bibliography of Accelerated Test Plans
05C3 Accelerated Destructive Degradation Test with Initiation Time
James Mendes, Intel (United States), Abishai Daniel (United States)
From a reliability perspective, it is crucial to understand the impact of transistor aging on an integrated circuit component to ensure functionality
throughout the specified lifetime of the part. This paper describes a Monte Carlo based statistical modeling framework to model aging in a GPIO interface on 32nm Intel chipset product.
Wayne Nelson, Wayne Nelson Statistical Consulting (United States)
This talk provides an updated bibliography of accelerated test plans with 85 additional references. The references will aid practitioners in selecting plans
and will stimulate researchers to develop needed plans.
Haitao Liao, University of Arizona (United States), Ye Zhang, University of Arizona (United States),
Yili Hong, Virginia Tech (United States)
The ability to accurately predict product reliability by conducting well-designed reliability tests is essential to today’s industry. Among various reliability
tests, degradation tests have been widely used, in which a product’s physical characteristic or performance is measured over time without waiting for
actual failures to occur. In particular, a destructive degradation test may provide more insightful reliability information than nondestructive alternative.
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05C4
Impact Analysis of Prior Distributions on ADT Bayesian Optimization Design Based on DIC
Tianji Zou, School of Reliability and Systems Engineering, Beihang University (China), Xiaoyang Li (China), Li Meijun (China)
This article focuses on the impact analysis of prior distributions on accelerated degradation testing Bayesian optimal design methods based on DIC,
which can guide the accelerated degradation testing optimal plan design when facing the selection problem of prior distributions.
Session 05D:
Tuesday 8:00 AM - 10:00 AM
Applied R&M Management for Industry Solutions
Stirling D-E-F
Moderator: Daniel Jacob, PTC, Inc. (United States)
Vice Chair: John Klohoker, NASA/Caltech Jet Propulsion Laboratory (United States)
This session will address the application of Reliability & Maintainability planning techniques used to manage supplier and product field reliability.
05D1 Function Based Reliability Targets Under Budgetary Constraints
05D2 Implementing a more-relevant reliability estimation process
05D3 Reliability & Maintainability Applications in Logistics & Supply Chain
05D4 On Optimal Inspection Interval for Minimizing Maintenance Cost
Michael Bartholdt, University of Stuttgart, Institute of Machine Components (Germany),
Bernd Bertsche, University of Stuttgart, Institute of Machine Components (Germany)
A method determining reliability targets based on functions’ value to the customer as well as warranty budgets.
Les Warrington, Ops A La Carte (United States)
A tool to help focus engineering effort across all potential causes of failure, improve project management and executive decisions, and provide
trustworthy customer warranty predictions.
Amanda Gillespie, SAIC (United States)
Applying R&M principles and methodologies to Logistics & Supply Chain data can create more efficient and effective supply chain and maintenance
procedures.
Athanasios Gerokostopoulos, ReliaSoft Corporation (United States), Huairui Guo, ReliaSoft (United States),
Ferenc Szidarovszky, ReliaSoft (United States), Pengying Niu, ReliaSoft (United States)
A method for determining the optimal inspection interval to minimize the total maintenance and failure cost will be proposed.
Session 05E:
Tuesday 8:00 AM - 10:00 AM
R & M Management Under New Challenges I
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Moderator: Mark White, NASA/Caltech Jet Propulsion Laboratory (United States)
Vice Chair: Troy Schwartz, Life Cycle Engineering (United States)
Effective management and identification techniques are examined to identify the optimum mix of applicable reliability and maintenance tasks needed to
overcome challenging inherent equipment design attributes.
05E1 A Study of the Quantitative Methods that Support Reliability Centered Maintanance (RCM) Operation
05E2 Early Detection for Quality & Reliability Management
05E3 A New Reliability Growth Model with Dual-Time Domain – A Hard Disk Drive Perspective
05E4 Susceptibility of Spacecraft to Impact-Induced Electromagnetic Pulses
Angelica Alebrant Mendes, Universidade Federal do Rio Grande do Sul (Brazil), Jose Luis Duarte Ribeiro (Brazil)
An investigation into an innovative approach integrating quantitative methods rather than qualitative methods to support Reliability Centered Maintenance (RCM) operations.
Mark Zhang, SMIC Corp Q&R, Shanghai, China (China) Wei-Ting Chien, SMIC, Shanghai, China (China),
Ming Li, SMIC Corp Q&R, Shanghai, (China)
In this paper, a general early detection methodology for quality and reliability management in semiconductor manufacturing was proposed and several
practical cases were introduced to clarify the recommended approaches.
Feng-Bin Sun, HGST A Western Digital Company (United States)
Practical examples are used to illustrate the application of a new reliability growth model that is defined within a dual-time domain: total test time (TTT)
and available (allowable) time between tests (ATBT).
Alexander Fletcher, Stanford University (United States), Donovan Mathias (United States), Sigrid Close, Stanford University (United States)
Computational simulations of meteoroid impacts on spacecraft are used to assess the threat of impact-generated electromagnetic pulses damaging
various spacecraft electronics.
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Tutorial 06B: Determining the Right Sample Sizes for your Test; Theory and Application Tuesday 10:15 AM - 12:15 PM
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Panel 06C:
Discreet Event Modeling Applied to Design Optimization in Different Industries
Tuesday 10:15 AM - 12:15 PM
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Athanasios Gerokostopoulos, ReliaSoft Corporation (United States), Huairui Guo, ReliaSoft (United States),
Ed Pohl, University of Arkansas (United States)
This tutorial discusses popularly used methods on determining sample sizes in reliability tests. The estimation approach which controls the widths of the
desired confidence intervals and the risk control approach which controls the manufacturer’s risks and consumer’s risk are explained in detail.
Moderator: Dan Deans, Millennium Engineering and Integration Company (United States)
Vice Chair: Dmitry Tananko, General Dynamics Land System (United States)
Panelists:
Paul Barringer, Barringer & Associates, Inc. (United States),
Mike Briggs, Millennium Engineering and Integration Company (United States),
Sean Carter, NASA Johnson Space Center (United States),
Andrew Melnyk, Independent Consultant (United States),
Mike Strobel, Fidelis Group (United States)
Although process and product improvement comes in many different shapes and forms, identifying, characterizing and mitigation failure modes and
hazards in systems is still a large part of the equation in optimizing performance. Thinking in failure space always pays off for a design team, whether
it be for hardware, software or systems, and with today’s focus on modeling, simulation and analysis, achieving design optimization using modeling
techniques is an inexpensive and effective process for exceeding requirements. Our esteemed panel will present and discuss how modeling is applied
in their industries of practice (aerospace, chemical processing, semiconductor, and general design) and will answer audience questions on how discrete
event modeling provides a large return on investment up-front in the development process.
Session 06D:
Tuesday 10:15 AM - 12:15 PM
Optimizing R&M Cost and Performance Stirling D-E-F
Moderator: Andrew F Bouma, Raytheon (United States)
Vice Chair: Steve Glenn, Raytheon Missile Systems (United States)
Novel approaches to balancing and optimizing Reliability and Maintainability performance and cost are presented by these session authors.
06D1 Optimal sustainable vehicle replacement model
06D2 Impact of system redundancies on optimization of the support solution
06D3 Optimal partly repairable spare inventory policy by MDP under warranty
06D4 Estimating and Using Direct Operating Cost as a Design Parameter
Sharareh Taghipour, Ryerson University (Canada), Nooshin Salari, Ryerson University (Canada)
We will develop an optimal truck replacement model with both economic and environmental considerations. The application of the model is shown in a
case study.
Tomas Eriksson, Systecon AB (Sweden)
The strengths of RBD analysis must be combined with the ability to model and optimize the support solution through simulation to achieve the highest
possible mission success rate.
Jiujiu Fan, Beihang University (China), Linhan Guo, Beihang University (China), Wang Naichao, Beihang University (China),
Yi Yang, Beihang University (China)
In this paper, we mainly analyze the inventory and repair decisions of partly repairable item under one-dimensional non-renewing warranty policy, and
model the process of spares inventory turnaround and repair or condemn decision in multi echelon organization by Markov decision process (MDP).
Mike Neus, Bell Helicopter (United States), Collin Zreet, Bell Helicopter (United States), Zhuoqi Chen, LEED Green Assoc (United States)
Establishes how Direct Operating Cost (DOC) can be estimated and used on a design program to control design.
Session 06E: Tuesday 10:15 AM - 12:15 PM
Reliability Testing Stirling G-H
Moderator: Vladimir Crk, UTC Aerospace Systems (United States)
Vice Chair: Wendai Wang, Thoratec Corporation (United States)
This session presents new techniques optimizing your reliability testing for quality and effectiveness.
06E1 Optimizing Reliability Testing with Limited Resources
Amanda Gillespie, SAIC (United States)
This paper will present a methodology developed to optimize testing resources for reliability and quality, both time and number of components required
for testing, given a limited budget environment.
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06E2 Life Test Design Leveraging Prior Knowledge
06E3 Reliability Demonstration Testing: Can We Afford 80% Confidence?
06E4 Bayesian Reliability Modeling for Pass/Fail Systems with Sparse Data
Jiliang Zhang, Tesla Motors (United States), Celine Geiger, Tesla Motors (United States)
This paper presents a classical statistics based method in utilizing prior knowledge in life test design.
Steve Rogers, Acquisition Logistics Engineering (United States), Darryl Kellner, Acquisition Logistics Engineering (United States)
This paper explores the challenges associated with balancing the cost of “over-design” of systems with the cost of additional testing to obtain the desired
80% confidence. It presents a cost-benefit methodology for helping to ensure reliability design margins and test durations are addressed early in the
acquisition program to support cost-effective decision making.
Zhaojun Li, Western New England University (United States), Allan Mense, Raytheon Company (United States)
Bayesian reliability approach is investigated for pass/fail systems when there is only limited testing data.
Tutorial 07A (Core):
Tuesday 1:30 PM - 3:30 PM
Introduction to Fault Tree Analysis
Tutorial 07B:
Tuesday 1:30 PM - 3:30 PM
Overview of Functional Safety Concepts & the IEC 61508 Standard
Session 07C:
Tuesday 1:30 PM - 3:30 PM
Advances in Life Data Analysis
Stirling O-P-Q
John Andrews, University of Nottingham (United Kingdom)
This tutorial describes the theory and application of the fault tree analysis method. The results it produces are interpreted in the context of the analysis
on an engineering system.
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William Goble, exida, LLC (United States), Julia Bukowski, Villanova University (United States)
Tutorial discusses basic concepts and principles of functional safety as well as IEC 61508 Functional Safety Standard.
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Moderator:Tao Yuan, University of Ohio (United States)
Vice Chair: Wendai Wang, Thoratec Corporation (United States)
Papers in this session discuss some recent advances in life data analysis.
07C1 A System for Design Decisions Based on Reliability Block Diagrams
07C2 Tool Replacement Based On Pattern Recognition with LAD
07C3 Nonparametric Data Reduction Approach for Large-Scale Survival Data Analysis
07C4 Life Data Analysis using competing failure modes Technique
Pankaj Shrivastava, Halliburton (United States), Bob Gissler, Halliburton (United States)
This paper highlights a successful application of the Reliability Block Diagram (RBD) as a decision-making tool for the design upgrades of a complex
system. The example of the downhole control system used in this paper demonstrates how RBDs can be applied in practice as an effective Design for
Reliability (DfR) Tool.
Soumaya Yacout, École Polytechnique of Montreal (Canada), Yasser Shaban, École Polytechnique of Montreal (Canada),
Marek Balazinski, École Polytechnique of Montreal (Canada)
We show how to exploit condition monitoring data in machining operation in order to extract intelligent knowledge, and use this knowledge to determine the tool replacement time.
Keivan Sadeghzadeh, Northeastern University (United States), Nasser Fard, Northeastern University (United States)
This paper presents an applied data reduction and variable selection approach for risk assessment and decision making in complex large-scale survival
data analysis.
Julio Pulido, ReliaSoft Corporation (United States)
The paper covers the application of life data analysis using competing failure modes technique with application to test data performed in mechanical
components for automotive industry. The objective is to identify the steps in selecting the right model (i.e. weibull, lognormal, mixed weibull) to better
model the data presented.
Session 07D:R&M Applications in AerospaceStirling D-E-F
Tuesday 1:30 PM - 3:30 PM
Moderator: Ramesh V. Anapathur, Boeing (United States)
Vice Chair: John Klohoker, NASA/Caltech Jet Propulsion Laboratory (United States)
This session examines some new techniques and practical applications of Reliability and Maintainability analyses as applied in the Aerospace industry.
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07D1 A Crack Monitoring Method Based on Microstrip Patch Antenna
07D2 Strain Measurement based on Microstrip Patch Antennas
07D3 A Power Loss Model for a Solar String with Mixed Cell Types
07D4 Battery Prognostics with Uncertainty Fusion for Aerospace Applications
Binbin Li, Xi’an Jiaotong University (China) , Mabao Liu, School of Aerospace, Xi’an Jiaotong University (China),
Hao Li, School of Aerospace, Xi’an Jiaotong University (China)
An investigation into the feasibility and capability of microstrip patch antenna sensors for crack monitoring of structural health.
Wenjuan Wang, School of Aerospace, Xi’an Jiaotong University (China), Teng Liu, School of Aerospace, Xi’an Jiaotong University (China),
Hangyu Ge, School of Aerospace, Xi’an Jiaotong University (China), Mabao Liu, School of Aerospace, Xi’an Jiaotong University (China)
An introduction to the strain measurement method and the linear relationship between the resonant frequency shift and the strain is validated on the
Microstrip Patch Antenna.
Wei Huang, Space Systems/Loral, LLC (United States), James Loman, Space Systems/Loral, LLC (United States),
Anne Bieniek, Space Systems/Loral, LLC (United States), Frank Pelkofer, Space Systems/Loral, LLC (United States)
A presentation of a power loss model developed for a solar string with two different types of solar cells.
Datong Liu, Harbin Institute of Technology (China), Wei Xie, The University of Arizona (United States),
Yu Peng, Harbin Institute of Technology (China), Siyuan Lu, Harbin Institute of Technology (China)
A hybrid data-driven approach for estimating the remaining useful life (RUL) of a battery for aerospace applications.
Session 07E: Tuesday 1:30 PM - 3:30 PM
Reliability Modeling Techniques I
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Moderator: Jessica Leszczynski, Sierra Nevada Corporation (United States)
Vice Chair: Masoud Pourali, University of Maryland (United States)
The papers in this session demonstrate new techniques to model various systems for reliability assessment and evaluation.
07E1 CCF structural reliability estimation under statistical uncertainty
07E2 Measuring reliability under aleatory and epistemic uncertainty
07E3 Mission Reliability Analysis of Phased-Mission Systems-of-Systems with Data Sharing Capability
07E4 Optimal availability improvement for digital switching systems
Ruoxing Gu, China Academy of Engineering Physics (China), Jin Qin (China)
In this paper, the reliability models of CCF structures caused by the randomness of load are developed and the estimation methods under statistical
uncertainty are proposed.
Zhiguo Zeng, Beihang University (China), Rui Kang, Beihang University (United States),
Meilin Wen, Beihang University (China), Yunxia Chen, Beihang University (China)
Belief reliability is defined as a measure of reliability presence of both aleatory and epistemic uncertainty. An evaluation method for belief reliability is
proposed and demonstrated with examples.
Behrokh Mokhtarpour, Southern Methodist University (United States),
Jerrell Stracener, Southern Methodist University (United States)
This paper presents a methodology for mission reliability modeling and analysis of a system of systems having a phased mission. The presented method
builds on existing methodology for a single complex system and considers the dynamic nature of SoS operation such as varying reliability configuration
on different phases.
Ruiying Li, Beihang University (China), Wei Xie, The University of Arizona (United States)
An optimal availability improvement method is proposed for digital switching systems. It aims at finding the optimal availability related metrics of
components that minimizing the cost subject to the system availability goal constraint. The problems caused by the networked structure and the multiple
failure modes are solved.
Tutorial 08A (Core):
Tuesday 3:45 PM - 5:45 PM
Understanding and Applying the Fundamentals of FMEA
Stirling O-P-Q
Carl Carlson, ReliaSoft Corporation (United States)
The purpose of this tutorial is to share the fundamental concepts and procedures for effective FMEAs and highlight the FMEA success factors.
Tutorial 08B:How to Give Outstanding Reliability Presentations
Tuesday 3:45 PM - 5:45 PM
Wayne Nelson, Wayne Nelson Statistical Consulting (United States)
This how-to tutorial provides easy steps for preparing and presenting outstanding reliability presentations.
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Panel 08C:
Tuesday 3:45 PM - 5:45 PM
Development and Training Needs for Reliability Engineers
Stirling I-J-K
Moderator: Trevor Craney, Shell Oil Company (United States)
Vice Chair: Masoud Pourali, University of Maryland (United States)
Panelists:
Dr. William Meeker, Iowa State University (United States),
Paul Wisnewski, Medtronic Inc. (United States),
Dr. Mohammad Modarres, University of Maryland (United States),
Brian Webster, Shell Oil Company (United States),
Phil Hensley, Sikorsky (United States)
This panel will look at the development and training needs for R&M engineers to perform in a variety of industries. The viewpoint is taken primarily
from that of several managers of reliability engineers, with an offset from the viewpoint of academia and what they are able to provide. The session
goal is to drive any available changes to academic programs, while also addressing the ongoing and continuing development of reliability engineers
throughout their careers. The continuing education needs revealed will guide future conference content and training courses for the RAMS community.
Session 08D:System Safety and Risk AnalysisStirling D-E-F
Tuesday 3:45 PM - 5:45 PM
Moderator: Debra S Herrera, Raytheon Company (United States)
Vice Chair: Steve Glenn, Raytheon Missile Systems (United States)
These session authors provide innovative approaches for bringing additional rigor to System Safety methodologies and approaches, in order to improve
and optimize safety related mission performance.
08D1 Infusing Reliability Techniques into Software Safety Analysis
08D2 SIL Requirements in Deepwater Drilling - Where Safety Meets ReliabilitY
08D3 Comparative Analysis of Static & Dynamic Probabilistic Risk Assessment
08D4 Safety driven optimization approach for automotive systems
Ying Shi, NASA/GSFC (United States)
A comprehensive approach for integrating reliability techniques into software safety analysis is proposed in this paper. This paper illustrates through
examples what traditional reliability techniques can be used, when and how to use these techniques in the overall software safety analysis process.
John Holmes, General Electric (Unites States)
Safety integrity levels (SIL), as defined by IEC61508 & IEC61511, are increasingly becoming necessary in the deepwater oil drilling industry. This session provides an overview of how SIL impacts the development of blowout preventer (BOP) systems.
Christopher Mattenberger, Science and Technology Corp. (United States)
A comparative analysis is performed to elucidate the similarities, differences, benefits and drawbacks of both static and dynamic, bottom-up, component-based probabilistic risk approaches using the reaction control system of a generic crewed spacecraft as a basis.
Mohamed Slim Dhoubi, VALEO - LARIS (France), Laurent Saintis, LARIS - ISTIA - Université d’Angers (France),
Mihaela Barreau, ISTIA (France), Jean-Marc Perquis, VALEO (France)
This paper presents an approach for helping automotive safety critical systems designers to reach an optimal architecture. The objective is to reach an
ISO 26262 compliant design without incurring unnecessary costs.
Session 08E:
Tuesday 3:45 PM - 5:45 PM
Accelerated Degradation and Life Testing
Stirling G-H
Moderator: Amanda Gillespie, SAIC (United States)
Vice Chair: Tongdan Jin, Texas State University (United States)
This session presents the latest advancement in reliability growth prediction using accelerated life testing including degradation data.
08E1 A Degradation Evaluation Method Based on Data from Multiple Conditions
08E2 ESS/HASS Effectiveness Model for Yield and Screen Profile Optimization
Lizhi Wang, Beihang University (China), Xiaohong Wang, Beihang University (China),
Tianji Zou, School of Reliability and Systems Engineering, Beihang University (China), Han Xu (China)
A new failure data analysis method is proposed in this paper.
Louis Gullo, Raytheon Missile Systems (United States), Stan Czerniel, Raytheon Missile Systems (United States)
This paper describes an Environmental Stress Screen (ESS) and Highly Accelerated Stress Screen (HASS) optimization model that was recently developed. These different ESS and HASS environmental screens include discrete and combined stress that include high temperature dwells, low temperature
dwells, temperature cycling, and two types of random vibration conditions which are compared in the model to determine the best manufacturing screen
for the product or system application.
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08E3 Accelerated Degradation Testing of Coating of PCB under Humid Heat Environment
Xiaoming Ren, Beihang University (China), Xiaohui Wang, Beihang University (China), Run Zhu, Beihang University (China)
In this paper, we design an accelerated degradation test for a typical kind of coating (ParyleneC) and use its test data to estimate the coating’s failure
time.
08E4 HALTs from Hell; Lessons Learned
James McLinn, Ops A La Carte (United States)
In most book and paper examples, the process of HALT is shown as being simple and some results are determined. Real life testing may not always be
that way.
Poster Session # 1 and Reception
Tuesday 6:00 PM - 8:00 PM
Edinburgh Ballroom West
Session Vice-Chair: Steve Glenn, Raytheon Missile Systems (United States)
Program Chair: Suprasad Amari, Consultant (United States)
This poster session will exhibit presentations covering a large variety of topical interests spanning reliability modeling, prediction and analysis, software
reliability, system safety, risk analysis, physics of failure, and space applications.
Matthew Avery, Institute for Defense Analyses (United States),
Yizhak Bot, BQR (Israel),
Karen Bowman, PTC (United States),
Ebru Nihal Cetin, TAI - Turkish Aerospace Industries (Turkey),
Taz Daughtrey, Cyber Security Information Analysis Center (United States),
Roland Duphily, The Aerospace Corporation (United States),
Marcin Hinz, University of Wuppertal (Germany),
Joseph Homer Saleh, Georgia Institute of Technology (United States),
Srinath Iyengar, United Launch Alliance (United States),
Xin Jiang, Beihang University (China),
Navid Khoshavi, University of Central Florida (United States),
Daniel Kosinski, US Army, TARDEC (United States),
Cai Yi Kun, Beihang University (China),
Khanh Le Son, Institut des Sciences et Techniques de l’Ingénieur d’Angers (France),
Min Luo, IEEE reliability society (China),
Nicholas O’Shea, University of Illinois at Urbana-Champaign (United States),
Fred Schenkelberg, FMS Reliability (United States),
Pidong Wang, Science and Technology on Reliability and Environment Engineering Laboratory (China),
Qingli Wang, Xi’an Jiaotong University (China),
Tianjian Wen, Beihang University (China),
WEDNESDAY JANUARY 28 SCHEDULE
Chairman’s Corner Stirling Ballroom West
Wednesday 7:45 AM - 8:00
General Chair: Keith Janasak, Raytheon Company (United States)
Tutorial 09A:
Wednesday 8:00 AM - 10:00 AM
Risk Management Principles and Techniques
Stirling O-P-Q
Rick Jones, Solomon Associates (United States)
This tutorial provides a foundation for scientists, engineers, and business executives to explicitly apply risk-based approaches to help solve problems in
their disciplines. The emphasis in the tutorial is on understanding risk and its many attributes, using both subjective and quantitative examples to
illustrate some widely-used risk management techniques.
Tutorial 09B:How to Customize a PFMEA Based on Manufacturing Processes
Wednesday 8:00 AM - 10:00
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Gabriel Lopez, Northrop Grumman Corporation (United States), Carlos Lopez, Northrop Grumman Electronic Systems (United States),
Louverture Pluviose, Northrop Grumman (United States)
This tutorial covers the detailed steps in conducting a Process Failure Modes and Effects Analysis (PFMEA) to identify and evaluate the potential
failures during product development and manufacturing processes.
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Session 09C:Accelerated Life Testing ApplicationsStirling I-J-K
Wednesday 8:00 AM - 10:00 AM
Moderator: Achutha Naikan, Indian Institute of Technology (India)
Vice Chair: Dave Fernald, ASQ–Electronics & Communications Div. (United States)
This session applies various RAMS tools to actual industrial concerns. Situations include accelerated testing and determining R&M parameters from
test and field data.
09C1 Influence of Tested Samples on Acceleration Factors Variation
09C2 Employing DOE to Optimize the Accelerated LifeTest Plan for TDDB
09C3 Agitation System Accelerated Life Testing
09C4 Flash-PLD Data Retention Times and Test Methods
Frank Jakob, University of Stuttgart, Institute of Machine Components (Germany),
Jochen Juskowiak, University of Stuttgart, Institute of Machine Components (Germany),
Bernd Bertsche, University of Stuttgart, Institute of Machine Components (Germany)
The influence of the deviation of estimated shape parameters at different stress levels is considered regarding the acceleration model and the lifetime
under field conditions. Differences between the lifetimes under field conditions obtained by the use of the assumption of a constant shape parameter will
be compared with a separate analysis considering the different shape parameters at each stress level.
Lingxiao Cheng, SMIC (China), Siyuan Frank Yang (China), Wei-Ting Kary Chien, SMIC (China), Xiaofeng Xu (United States)
In this work, a statistical tool JMP with optimal experimental design platform for accelerated life test (ALT) is employed to select stressing conditions
and to optimize the ALT test plan with a special distribution of sample size for each stressing condition, model parameter estimation as well as the
lifetime projection.
Kummar Belanke, iGATE Global Solutions Ltd. (India), Mukund Bagal, iGATE Global Solutions Ltd. (India),
Sidharth Singh, iGATE Global Solutions Ltd. (India)
This abstract presents the Accelerated Life Testing (ALT) approach for test plan with optimized test samples, test duration and test parameters to
determine the product life and detect the design failures.
Gary Warren, SAIC (United States), Michael Demmick (United States), Russell Warren, SAIC (United States)
Various sources report Flash data retention times much shorter than predicted by standard Arrhenius test methods; we report improved methods,
including our own.
Session 09D:Reliability Modeling Techniques IIStirling D-E-F
Wednesday 8:00 AM - 10:00 AM
Moderator: Natesan Jambulingam, NASA (United States)
Vice Chair: Masoud Pourali, University of Maryland (United States)
The papers in this session demonstrate new techniques to model various systems for reliability assessment and evaluation.
09D1 Reliability Analysis of a Hybrid Car Drive System with ECSPN
09D2 Probabilistic Competing Failure Analysis in Body Sensor Networks
09D3 Bayesian Network for Reliability Prediction in Functional Design Stage
09D4 Reliability modeling of hydrogen fuel cells using Petri-Net simulation
Timo Rieker, University of Stuttgart, Institute of Machine Components (Germany),
Peter Zeiler, University of Stuttgart, Institute of Machine Components (Germany),
Bernd Bertsche, University of Stuttgart, Institute of Machine Components (Germany)
In this paper we will show how to calculate the operational reliability of a hybrid car drive system by the means of modeling and simulation.
Yujie Wang, UMass Dartmouth (United States), Liudong Xing, UMass Dartmouth (United States),
Honggang Wang, UMass Dartmouth (United States), Gregory Levitin, The Israel Electric Corporation Ltd. (Israel)
This paper models the reliability of Body Sensor Networks considering two different statistical relationships between local and propagated failures of
biomedical sensors as well as competing failure propagation and probabilistic failure isolation effect.
Petek Yontay, Arizona State University (United States), Luis Mejia, Arizona State University (United States),
Rong Pan, Arizona State University (United States)
Over the last decade, Bayesian networks have become a popular tool for modelling reliability applications. In this work we will discuss how to integrate
multiple objective and subjective sources of information, such as historical data from parent products and expert opinions on design changes, to quantify
the Bayesian network model.
Michael Whiteley, Loughborough University (United Kingdom), Ashley Fly, Loughborough University (United Kingdom),
Johanna Leigh, Loughborough University (United Kingdom), Lisa Jackson, Loughborough University (United Kingdom),
Sarah Dunnett, Loughborough Univeristy (United Kingdom)
Hydrogen fuel cells are zero-emission energy conversion devices which suffer from reliability concerns. Petri-Net simulation has been used to advance
this area of research.
17
2015
Session 09E:
Wednesday 8:00 AM - 10:00 AM
Statistical Methods for R&M
Stirling G-H
Moderator: Mohammad Hijawi, Fiat Chrysler Automobiles (Unites States)
Vice Chair: Steve Glenn, Raytheon Missile Systems United States)
These session authors provide methods and approaches for modeling, analyzing and forecasting reliability performance within a variety of situations.
09E1 a Bayesian approach for complex system utilizing imperfect information
Lechang YANG, Science and Technology on Reliability and Environment Engineering Laboratory (China), Pidong Wang, Science and
Technology on Reliability and Environment Engineering Laboratory (China),
Jianguo Zhang, Science and Technology on Reliability and Environment Engineering Laboratory (China),
Yanling Guo, School of Automation Science and Electrical Engineering (China)
In this paper, a general inference taking account of all relevant information (probabilistic, interval, fuzzy) based on the maximum entropy principle is
formulated.
09E2 Statistical analysis of Accelerated life testing under Weibull distribution based on fuzzy theory
09E3 Acceleration Methods for Monte Carlo Simulation of Rare Events
09E4 Warranty Forecasting of Electronic Boards using Short-term Field Data
Han Xu, Science & Technology on Reliability & Environmental Engineering Laboratory, School of Reliability and Systems Engineering,
Beihang University (China), Xiaoyang Li, Science & Technology on Reliability & Environmental Engineering Laboratory, School of Reliability
and Systems Engineering, Beihang University (China), Le Liu, Science & Technology on Reliability & Environmental Engineering Laboratory,
School of Reliability and Systems Engineering, Beihang University (China)
The abstract gives a brief introduction about how to establish a statistical model of accelerated life testing based on fuzzy theory.
Maider Estecahandy, UPPA-TOTAL (France), Laurent Bordes, UPPA, LMAP (France),
Stéphane Collas, TOTAL S.A. (France), Christian Paroissin, UPPA, LMAP (France)
In the oil and gas industry, obtaining accurate reliable estimators on safety barrier is an important issue that can lead to very long computing times. To
address this issue, we propose an extension of a truncation method and we introduce a new computational technique called Dissociation.
Mustafa Altun, Istanbul Technical University (Turkey), Salih Cömert, Istanbul Technical University (Turkey),
Mustafa Nadar, Istanbul Technical University (Turkey), Ertunc Erturk, Arcelik R&D, Electronics Evaluation (Turkey)
In this study, we make a precise reliability prediction of electronic boards throughout their warranty period by using their short-term field return data.
Panel 10 Advisory Board Panel Wednesday 10:15 AM - 12:15 PM
Edinburgh Ballroom East
Leaders from academia, industry and government will communicate their perspective on why Unleashing R&M Knowledge is critical in today’s business environment and how this process supports optimization of systems across the development and operational lifecycle. Symposium attendees may
submit questions in advance to the panelists or raise them from the floor.
Moderator: Dan Deans, Millennium Engineering and Integration Company (United States)
Panelists:
David W. Coit, Rutgers University (United States),
Susan L. Hall, Millennium Engineering and Integration Company (United States),
Andrew Monje, Office of the Deputy Assistant Secretary of Defense (United States),
Ali Mosleh, University of California, Los Angeles (United States),
Alan H. Phillips, NASA Safety Center (United States),
Randolph G. Phillips, Baker Hughes (United States),
Pantelis Vassiliou, ReliaSoft Corporation (United States)
Tutorial 11A:
Optimization Methods in Reliability and Maintainability
Wednesday 1:30 PM - 3:30 PM
Stirling O-P-Q
Ed Pohl, University of Arkansas (Unites States), Thomas Yeung, École des Mines de Nantes (France)
This tutorial provides an overview of the various optimization techniques most often used in R &M. Key models in both reliability and maintainability
are presented along with model-specific solution procedures.
Tutorial 11B:
Intro to Quantification of Burn-In & Environmental Stress Screening (ESS)
Wednesday 1:30 PM - 3:30 PM
Stirling L-M-N
Feng-Bin Sun, HGST, A Western Digital Company (United States)
This tutorial presents a comprehensive review of statistical and physical quantification techniques associated with Burn-In and Environmental Stress
Screening (ESS), and provides attendees with a guideline for practical applications.
18
2015
Panel 11C:
Reliability: The Next Frontier in Safe Patient Care
Wednesday 1:30 PM - 3:30 PM
Moderator: Dav Raheja, Consultant Patient System Safety (United States)
Stirling I-J-K
Vice Chair: Wendai Wang, Thoratec Corporation (United States)
Panelists:
Aron Brall, ARES Technical Services (United States),
Dr. Maria Escano, Innovative Catalyst Ventures, Inc. (United States),
Vaishali Hegde, Philips Respironics (United States)
Sallie J. Weaver, Johns Hopkins University (United States),
Healthcare still operates in silos with the result that over 400,000 deaths are caused by medical errors. Another 2,000,000 patients get infections from
hospitals. There is some progress but the overall progress is insignificant. System knowledge needs to be implemented in order to work as a system. The
focus is on how components and processes have to be integrated to focus on patient safety.
Session 11D: Strategies for Risk Avoidance Using FMEA
Wednesday 1:30 PM - 3:30 PM
Stirling D-E-F
Moderator: Sanjay Chaturvedi, Indian Institute of Technology (India)
Vice Chair: Troy Schwartz, Life Cycle Engineering (United States)
By expanding beyond the fundamental FMEA approaches, this session aims to protect companies through the development of realistic strategies to drive
risk avoidance.
11D1 Risk Evaluation of STS Transfer Operations by Applying PFMEA and FIS
11D2 Capture All Critical Failure Modes into FMEA in Half the Time
11D3 Electric Field Mapping Inside Metallized Film Capacitors
11D4 A Failure Mode Avoidance Approach to Reliability
Dimitrios Stavrou, NTUA (Greece), Nikolaos Ventikos, NTUA (Greece)
The objective of this study is to assess and evaluate different hazardous scenarios in an STS transfer operation implementing the PFMEA in combination
with the fuzzy inference system (FIS).
Howard C Cooper, General Dynamics - Land Systems Reliability (United States)
FMEA preparation can be fast and verifiably complete by using a Function-to-Hardware Decomposition Table. Critical Item functions can be prioritized
before populating the FMEA and FMEA activities can be completed in less than half the time.
Dennis Nielsen, Aalborg University (Denmark), Vladimir Popok, Aalborg University (Denmark), Kjeld Pedersen (Denmark)
In this work we use a micro-sectioning approach together with optical microscopy to analyze film capacitors. The prepared capacitors are further
investigated by electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) with the aim of detecting abnormalities in material
properties or electric field distributions that can be linked to component degradation and particular failure mechanisms.
Anamika Saxena, University of Warwick (United Kingdom), Jeff Jones (United Kingdom), Tim Davis (United Kingdom)
The work focuses on developing a parsimonious approach to detect and mitigate failure modes in the product development process via a conceptual
analytical model built around the FMEA.
Session 11E:
Physical Failure Modeling & Applications II
Wednesday 1:30 PM - 3:30 PM
Stirling G-H
Moderator: Thomas Elwell, Honeywell International, Inc. (United States)
Vice Chair: Dmitry Tananko, General Dynamics Land System (United States)
The second session dedicated to Physical Failure Modeling and the proper applications and examples of such modeling.
11E1
Practical Applications of Semiconductor Reliability Modeling
11E2
A Unifed Model Approach for Solder Joint Life Prediction
11E3
Rocket Engine Failure Propagation Using Self-evolving Scenarios
Lori Bechtold, Boeing (United States), Bahig Tawfellos, Honeywell Aerospace (United States),
David Sunderland, Boeing (United States), Florian Moliere, Airbus Group (France)
A practical methodology for modeling the reliability of deep submicron (<90 nm) semiconductor microcircuits provides timely and needed information
for the integration of commercial-off-the-shelf (COTS) electronics in airborne and high reliability applications.
Gurmukh Advani, North Dakota State University (United States), Om Prakash Yadav, North Dakota State University (United States)
Extreme thermo-mechanical stresses pose a significant challenge to solder joint reliability in ruggedized electronics for harsh environments. This study
proposes a Comprehensive Model Approach that also accounts for impact of elastic strains on solder joint fatigue life predictions.
Donovan Mathias, NASA (United States), Samira Motiwala, NASA Ames Research Center (United States)
This paper describes an approach to simulating failure propagation through the engine bay of a launch vehicle. The Monte Carlo-based approach is
constructed using physical models, and component interaction rules, which allow failure sequences to naturally evolve.
19
2015
11E4
Electro-Thermal Modeling of IGBT with Experimental Validation
Rui Wu, Aalborg university (Denmark), Francesco Iannuzzo, University of Cassino and southern Lazio (Italy),
Huai Wang (Denmark), Frede Blaabjerg (Denmark)
This paper proposes an electro-thermal modeling method of commonly-used power semiconductor Insulated-Gate Bipolar Transistors(IGBTs), aimed
for modern reliability design of large-size power modules under severe conditions, which is further validated by short-circuit tests of 6kA/1.1kV nondestructive-tester.
Tutorial 12A:
Practical Approaches for Reliability Evaluation using Degradation Data
Wednesday 3:45 PM - 5:45 PM
Stirling O-P-Q
Tutorial 12B:
Wednesday 3:45 PM - 5:45 PM
Electronic Part Failure Analysis Tools and Techniques
Stirling L-M-N
Session 12C:
Wednesday 3:45 PM - 5:45 PM
R&M Applications in Manufacturing
Huairui Guo, ReliaSoft (United States), Haitao Liao, University of Arizona (United States)
This tutorial introduces the basic concept of degradation modeling and some practical approaches to reliability evaluation using degradation data.
Jonathan Fleisher, Northrop Grumman Corp. (Unites States)
This tutorial presents a “Process” as well as the tools and techniques required to perform effective failure analyses on electronic components.
Stirling I-J-K
Moderator: Noah Lassar, Google[X] (United States)
Vice Chair: Tongdan Jin, Texas State University (United States)
This session discusses new advances in design for reliability and maintenance planning for high-voltage power circuits, printed circuit boards in semiconductor industry, and optimal maintenance scheduling applicable to general capital equipment.
12C1 Mechanical Reliability of a 126kV Single-break Vacuum Circuit Breaker
12C2 Board Level Reliability Enhancements for Wafer Level Package
12C3 On application of an imperfect repair model in maintenance scheduling
12C4 Cost Effectiveness of Condition Based Maintenance in Manufacturing
Xiaofei Yao, Department of Electrical Engineering, Xi’an Jiaotong University (China),
Zhiyuan Liu, Xi’an Jiaotong University (China), Yingsan Geng, Xi’an Jiaotong University (China),
Jianhua Wang, Xi’an Jiaotong University (China)
The objective of this paper is to extend mechanical endurance of a 126kV single-break VCB by analyzing and improving low-cycle metallic fatigue
crack broken parts.
Wenwen He, Semiconductor Manufacturing International (Shanghai) Corp. (China),
John Qiao, Semiconductor Manufacturing International (Shanghai) Corp. (China),
Kelly Yang, Semiconductor Manufacturing International (Shanghai) Corp. (China),
Wei-Ting Chien, SMIC, Shanghai, China (China)
Investigates the enhancements of wafer level package (WLP) board level reliability (BLR) with a recommended BLR characterization procedure.
Dinh Tuan Nguyen, University of Technology of Troyes (France), Mitra Fouladirad, University of technology of Troyes (France),
Yann Dijoux, University of Technology of Troyes (France)
In this paper, we present a new development for two classical maintenance policies with an imperfect repair model. We relax the assumption on
complete replacement and propose a more general framework in building optimal maintenance policy.
Ali Rastegari, Volvo GTO (Sweden), Marcus Bengtsson, Mälardalen University (Sweden)
This paper presents a guide to evaluate the costs or profits of implementing Condition Based Maintenance (CBM) in a manufacturing industry, plus
some results of CBM cost evaluation from a real-life implementation.
Session 12D:Risk Informed Decision MakingStirling D-E-F
Wednesday 3:45 PM - 5:45 PM
Moderator: Philip A Bedard, Raytheon Company (United States)
Vice Chair: Steve Glenn, Raytheon Missile Systems United States)
Papers in this session describe approaches to modeling failures, reliability growth and risk analyses for better risk optimization to ensure mission
reliability.
12D1 20
Modeling of Function Failure Propagation Across Uncoupled Systems
Bryan O’Halloran, Raytheon Missile Systems (United States), Nikolaos Papakonstantinou, Aalto University (Finland),
Douglas Van Bossuyt, Colorado School of Mines (United States)
A geometric functional model method of analyzing model-based functional failure propagation across uncoupled systems within complex systems during conceptual design is presented. Failure flow paths between normally uncoupled functions are examined and methods to mitigate uncoupled failure
flow propagation using both geometric and barrier means are detailed.
2015
12D2 Quantitative Mission Risk Assessment for Space Missions
12D3 A quantitative model of equipment development quality risk conduction
12D4 Reliability Growth Planning Curves Based on Multiple Phase Projections
Andrew Hsu, The Aerospace Corporation (United States)
Through the diagramming of risk scenarios, probabilistic risk assessment, and objective communication of the risk analysis, senior decision-makers can
make better informed choices. An illustration of the mission risk assessment approach drawn from an actual case study for a satellite is provided.
Shaoqi Zhou, Beihang University (China), Wenbing Chang, Beihang University (China),
Sheng-han Zhou, Beihang University (China), Wei Liu, Beihang University (China)
This paper uses fuzzy theory and cloud theory to build a quantitative model of equipment development quality risk conduction.
Larry Crow, Crow Reliability Resources, Inc. (United States)
Presents a methodology for progressively constructing an updated reliability growth planning curve and multiple projections across all future test phases
based on test data.
Session 12E:
Wednesday 3:45 PM - 5:45 PM
Prognostics and Health Management II
Stirling G-H
Moderator:Venkatesh Agaram, PTC (United States)
Vice Chair: Masoud Pourali, University of Maryland (United States)
The papers in this session show how prognostics and health management (PHM) tools are used to continuously evaluate systems’ health and assure their
operable condition.
12E1 Modelling System Based on Fuzzy Dynamic Bayesian Network for Fault Dia
12E2 A Dual-parameter Optimization KPCA Method for Process Fault Diagnosis
12E3 Multiple Failure Modes Prognostics Using Logical Analysis of Data
12E4 Computational Algorithm for Hybrid DBN in On-line SHM Applications
Jiao Li, Beihang University, Xiaogang Li, Beihang University (China)
The quantitative analysis of a FDBN can proceed along two lines, the forward (or predictive) analysis and backward (or diagnostic) analysis. Hence this
method not only gives accurate reliability prediction, but also fault diagnosis.
Jiang Hongquan (China), Xu Gao (China), Zhiyong Gao (China),
Yunlong Li, State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University (China)
A KPCA method for Process Fault Diagnosis based on Dual-parameter optimization is developed, which the effect of kernel parameters and the number
of principal component on dimensionality reduction are both taken into account.
Soumaya Yacout, École Polytechnique of Montreal (Canada), Ahmed Ragab, École Polytechnique of Montreal (Canada),
Mohamed-Salah Ouali, École Polytechnique of Montreal (Canada), Hany Osman, École Polytechnique of Montreal (Canada)
We propose a multiple fault prognostic methodology which considers the condition monitoring data collected from equipment that experiences several
different failure modes.
Chonlagarn Iamsumang, University of Maryland (United States), Ali Mosleh, University of Maryland (United States),
Mohammad Modarres, University of Maryland (United States)
Computational Algorithm and Modeling for Dynamic Hybrid Bayesian Network in On-line System Health Management Applications
General Reception & Banquet
Wednesday 6:30 PM - 9:30 PM
Inverness Foyer & Ballroom
Banquet Speaker James Wasiloff
Mr. James M. Wasiloff is the Director of Continuous Process Improvement at TACOM LCMC in the Strategic Planning
& Transformation Directorate for the United States Army. Mr. Wasiloff will highlight the recent exponential growth in
Driverless Car/Autonomous Vehicle technology and the significant impact of the “Voice of the Customer.”
21
2015
THURSDAY JANUARY 29 SCHEDULE
Chairman’s CornerStirling Ballroom West
Thursday 7:45 AM - 8:00AM
General Chair: Keith Janasak, Raytheon Company (United States)
Tutorial 13A: Thursday 8:00 AM - 10:00 AM
Experiences in Reliability Data Analysis
Stirling O-P-Q
William Meeker, Iowa State University (United States), Luis Escobar, Louisiana State University (United States)
The purpose of this tutorial is to illustrate the appropriate statistical methods for analyzing different kinds of reliability data including both field data and
accelerated test data. This tutorial will present a series of examples to illustrate the points made.
Tutorial 13B: Interpretable Pattern-Based Machine Learning for Condition-Based Maintenance Stirling L-M-N
Thursday 8:00 AM - 10:00 AM
Ahmed Ragab, École Polytechnique of Montreal (Canada)
In this tutorial a knowledge discovery approach called Logical Analysis of Data (LAD) is applied to the field of condition-based maintenance (CBM)
diagnostics and prognostics.
Session 13C:Business Intelligence in ReliabilityStirling I-J-K
Thursday 8:00 AM - 10:00 AM
Moderator: Georgios Sarakakis, Tesla Motors (United States)
Vice Chair: Troy Schwartz, Life Cycle Engineering (United States)
Leveraging business intelligence and big data, this session examines how reliability can be improved through strategic leadership at all levels of an
organization.
13C1 Leveraging Big Data to Improve Reliability & Maintainability
13C2 Design Integration of Hosted Payloads - Do No Harm Analysis
13C3 Aridity as a Factor in Estimating the Lifespan of Electronic Systems
13C4 Thermodynamic Damage Measurements of an Operating System
Jun Li, NetApp Inc. (United States), Brad Reger (United States), Steve Miller (United States)
This paper shares how NetApp leverages big data from NetApp’s AutoSupport feature to deliver industry leading reliability and preventive maintenance.
Jack Kawamoto, The Aerospace Corporation (United States), Kenneth Dodson, SSL (United States),
Steven Kuritz, Northrop Grumman Corporation (United States)
Do No Harm Analysis evaluates fault propagation between Host/Payload, EMI/EMC, incompatible requirements, contamination, and related factors
affecting mission success.
Khaled Abuhasel, Salman Bin Abdulaziz University (Saudi Arabia), Abdullah Iliyasu, Tokyo Institute of Technology (Japan),
Mohamed A. Al-Qodah, Salman Bin Abdulaziz University (Saudi Arabia), Ismail Arafat, Salman Bin Abdulaziz University (Saudi Arabia)
The proposed study explores the impact of environmental stresses (temperature, humidity, dust, etc.) that are prevalent in the arid regions, such as those
found in desert Kingdom of Saudi Arabia, on the useful life of biomedical electronic devices used in treating and/or managing some respiratory, cardiovascular and other intractable diseases.
Alec Fineberg, DfRSoft (United States)
New thermodynamic method for measuring damage in an operating system can lead to the ability to warn of impending failure even in
complex systems.
Session 13D:Network Modeling and AnalysisStirling D-E-F
Thursday 8:00 AM - 10:00 AM
Moderator: Liudong Xing, UMASS (United States)
Vice Chair: Dave Fernald, ASQ–Electronics & Communications Div. (United States)
This session includes papers covering various network types. The papers discuss both network modelling as well as innovative analysis procedures.
13D1 An Improved d-MP Search Algorithm for Mulit-State Networks
Guanghan Bai, University of Alberta (Canada), Ming Zuo, University of Alberta (Canada), Zhigang Tian, University of Alberta (Canada)
We report a recursive algorithm based on the concept of backtracking to search for all the d-MPs for all possible integer d values. By computational
experiments, it is found that the proposed algorithm is more efficient than existing algorithms for finding all d-MPs for all possible integer d values. The
generated d-MPs can be used for system state distribution evaluation.
22
2015
13D2 Reliability Analysis of Underwater Sensor Network Packet Transmission
13D3 An Application Oriented Evaluation Method for Network Performance Reliability
13D4 A new model of network cascading failures with dependency nodes
Lance Fiondella, University of Massachusetts Dartmouth (United States), Swapna Gokhale, University of Connecticut (United States)
Jun-Hong Cui, University of Connecticut (United States)
This paper presents a framework to assess alternative end-to-end routing mechanisms designed to improve the transmission reliability of an underwater
sensor network. The framework utilizes the normalized energy consumption (NEC) metric to consider the energy efficiency and the reliability of the
routing mechanisms in an integrated manner.
Yue Zhang, Beihang University (China), Ning Huang (China), Weiqiang Wu, Beihang University (China)
We analyze the coupling relationship between network applications, build the coupling application models and study the application’s influence on the
network reliability.
Jian Zhou, Beihang University (China), Ning Huang (China), Xiaolei Sun, Beihang University (China), Kunlong Wang (China),
HongQi Yang, Beihang University (China)
Based on previous studies and complex network theories, we analyze the effect of dependencies between network nodes on propagation of cascades,
and construct a new cascading failure model considering the synergy existing between dependency groups of nodes and dynamic distribution of network
loads.
Tutorial 14A:
Thursday 10:15 AM - 12:15 PM
Engineering Availability in Systems of Systems
Tutorial 14B:
Thursday 10:15 AM - 12:15 PM
FTA vs. RBD – Differences and Similarities for System Modelling
Stirling O-P-Q
Pierre Dersin, ALSTOM Transport (France), René Valenzuela, ALSTOM Transport Information Solutions (France)
This tutorial discusses various aspects of modelling and analyzing the availability of complex systems.
Stirling L-M-N
Vesna Dakic, Bombardier Transportation, Berlin (Germany)
This tutorial presents the basic differences between fault tree analysis (FTA) and reliability block diagram (RBD) tools, identifies common
mistakes in implementation, and identifies best practices in the application of these techniques.
Session 14C:R&M Applications in ServiceStirling I-J-K
Thursday 10:15 AM - 12:15 PM
Moderator: Howard Cooper, General Dynamics Land System (United States)
Vice Chair: Tongdan Jin, Texas State University (United States)
This session focuses on reliability modeling and preventive maintenance decision making using simulation tools, multiple decision schemes, and unstructured data.
14C1 Leveraging unstructured data to detect emerging reliability issues
14C2 Simulation for psychological factors – considered repair based on swarm
14C3
Insights into Process Reliability through Simulation
14C4 Maintenance Resource Planning for Utility Poles in a Power Network
Deovrat Kakde, SAS Institute (United States), Arin Chaudhuri, SAS Institute (United States)
This paper outlines how text mining can be used to analyze customer complaints and develop an early warning system.
Xuhua Liu, Beihang University (China), Lin Ma, Beihang University (China),
Longfei Yue, Beihang University (China), Haoran Deng, Beihang University (China)
Under battlefield conditions, the effectiveness of human emotion cannot be ignored. The battlefield maintenance model is built based on Multi-Agent
simulation method with swarm as the platform, describing battle space and establishing the equipment, maintenance personnel agent with characteristics
such as life, psychological value.
Venkatesh Agaram, PTC, Inc. USA (United States), Julian Venegas, PTC, Inc. (United States)
The paper presents results of a study involving process simulation tools and traditional statistical tools aimed at gaining insights into the impact of
process control variables and their variations on the reliability of overall process performance.
Maliheh Aramon Bajestani, University of Toronto (Canada), Neil Montgomery, University of Toronto (Canada),
Dragan Banjevic, University of Toronto (Canada), Andrew Jardine, University of Toronto (Canada)
In the context of utility poles, we study the problem of maintenance resource planning for industries that usually have large and dynamic populations
of assets in their distribution networks. Our goal is to find a preventive maintenance strategy that limits the expected number of failures over a fixed
interval.
23
2015
Session 14D:
Thursday 10:15 AM - 12:15 PM
R&M Management Under New Challenges II
Stirling D-E-F
Moderator: Vaishali Hegde, Philips Respironics (United States)
Vice Chair: John Klohoker, NASA/Caltech Jet Propulsion Laboratory (United States)
This session will address the challenges of R & M Management and the techniques being developed to face them.
14D1 System Availability Analysis under Redundancy Sharing of Standby Components
14D2 A Vision for Spaceflight Reliability: NASA’s Objectives Based Strategy
14D3 The Electronic Maintenance Situational Awareness Interface
14D4 A Petri Net Model for Electrical Power Systems Operating Procedures
Tongdan Jin, Texas State University (United States), Haitao Liao, University of Arizona (United States),
Wei Xie, University of Arizona (United States), Wilkistar Otieno, University of Wisconsin-Milwaukee (United States)
A proposed approach to improve system availability by implementing a redundancy sharing scheme that allows standby components to be dynamically
transferred from a working system to any system that is entering a down state.
Frank Groen, NASA HQ (United States), John Evans, NASA HQ (United States),
Anthony Hall, Information Systems Laboratories (United States)
In defining the direction for a new standard, NASA’s Office of Safety and Mission Assurance has started from first principles by extracting critical
objectives that our projects need to complete a reliable mission and then structuring these objectives to lead mission planning.
Allan Cesar Moreira de Oliveira, Federal University of Sao Carlos (Brazil), Clayton VanVolkenburg, University of Toronto (Canada),
Andrew Jardine, University of Toronto (Canada), Regina Borges de Araujo, Federal University of Sao Carlos (Brazil)
An introduction to a conceptual framework to Situational Awareness applied in designing systems for maintenance technicians resulting in improved
efficiency and safety.
Giovanni Vescio, Technip (Italy), Paolo Riccobon, Technip (Italy), Umberto Grasselli, Università Sapienza Rome - DIAEE (Italy),
Francesco De Angelis, University of Rome La Sapienza DIAEE (Italy)
An introduction to the domain of electrical system operating procedures, a Petri nets model for a sample operating procedure, and an explanation as to
how static/structural analysis (invariants) and dynamic analysis (reachability trees) can be used to reason about the operating procedures’ properties.
Poster Session 2 and iPad Air 2 RaffleEdinburgh Ballroom West
Thursday 12:15 PM - 2:00 PM
Session Vice-Chair: David Fernald, ASQ–Electronics & Communications Div. (United States)
Program Chair: Suprasad Amari, Consultant (United States)
This is a chance to have a face-to-face meeting with paper authors and ask individual questions about their work.
The papers in this poster session cover a broad variety of RAMS® topics.
Zhipeng Hao, IEEE Reliability Society (China),
Wenwen He, Semiconductor Manufacturing International (Shanghai) Corp. (China),
Bentolhoda Jafary, University of Massachusetts (United States),
Hailong Jing, Beihang University (China),
Vasiliy Krivtsov, Ford Motor Company (United States),
Ruiying Li, Beihang University (China),
Xiaopeng Li (China),
Behrokh Mokhtarpour, Southern Methodist University (United States),
Allan Cesar Moreira de Oliveira, Federal University of Sao Carlos (Brazil)
Vidhyashree Nagaraju, University of Massachusetts (United States),
Fred Schenkelberg, FMS Reliability (United States)
Pankaj Shrivastava, Halliburton (United States),
Xiaolei Sun, Beihang University (China),
Rui Wu, Aalborg University (Denmark),
Weiqiang Wu, Beihang University (China),
Soumaya Yacout, École Polytechnique of Montreal (Canada),
Xiaofei Yao, Xi’an Jiaotong University (China),
Jianyu Zhao, IEEE Reliability Society (China),
Amir Zonouz, University of Massachusetts, Dartmouth (United States),
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2015
RAMS® 2015 DISCIPLINE TRACKS
While all sessions will contain elements of interest for the majority of participants, special disciplines
are emphasized in individual sessions. If your profession tends to specialize in the areas listed in the first
column below, we recommend you attend the sessions listed opposite your specialty.
MONDAY
Participants
Specialty
10:15AM
12:15PM
1:30 3:30PM
Data Analysis
1C
2B, 2C,
2D
Design/
Development
1B, 1D
2C
Maintainability
1A, 1D
TUESDAY
1:30 3:30 PM
3:45 5:45 PM
9C, 9D,
9E
10
11A, 11B,
11E
9A, 9B,
9C, 9D
10
9D, 9E
8E
10:15 12:15 PM
1:30 3:30 PM
3:45 5:45 PM
8:00 10:00 AM
5A, 5C,
5E
6A, 6B,
6E
7C, 7E
8E
3A, 3B,
3D, 3E
5C
6C, 6D
7A, 7B,
7D, 7E
8A, 8C,
8D, 8E
2A, 2B,
2E
3A, 3C,
3D, 3E
5D, 5E
6D
7D, 7E
Maintenance
2B, 2D,
2E
3D, 3E
5D, 5E
6C, 6D
7B
Management
2D, 2E
3A, 3C,
3E
5D, 5E
2A, 2B,
2C, 2D,
2E
3A, 3B,
3C, 3D,
3E
5A, 5B,
5C, 5D,
5E
6B, 6C,
6D, 6E
2E
3D, 3E
5B
6D
1A, 1B,
1C, 1D
Risk Management and
Analysis
3B, 3D
Safety &
Security
1C
2B, 2E
3D, 3E
5B
Simulation &
Modeling
1D
2C, 2D,
2E
3E
5B
Software
1C
Statistics &
Probability
1A, 1B
2A, 2B,
2C
3D
Systems
Engineering
1D
2E
3A, 3B,
3C, 3D
2C
3D
Test and
Evaluation
1C
6C
THURSDAY
10:15 12:15
PM
8:00 10:00 AM
Reliability
3:45 5:45PM
WEDNESDAY
8:00 10:00 AM
10:15 –
12:15 PM
12A, 12E
13A, 13C
14D
11A, 11B,
11C, 11D,
11E
12B, 12D,
12E
13D
14B
10
11A
12A, 12C,
12D, 12E
13B, 13D
14A, 14B,
14C, 14D
9E
10
11C
12A, 12C,
12D, 12E
13A, 13B,
13C
14B, 14C,
14D
8C
9A
10
11C
12D
13B, 13C
14C, 14D
7A, 7B,
7C, 7D,
7E
8A, 8B,
8C, 8D,
8E
9A, 9B,
9C, 9D,
9E
10
11A, 11B,
11C, 11D,
11E
12A, 12B,
12C, 12D,
12E
13A, 13B,
13C, 13D
14A, 14B,
14C, 14D
7A, 7B
8A, 8D
9A, 9B,
9E
10
11A, 11B,
11C, 11D
12D, 12E
13B, 13C
14C
7A, 7B
8D
9A
10
11A, 11C
12D, 12E
13D
14B, 14C
7E
8D
9D, 9E
10
11A, 11E
12A, 12C,
13C, 13D
14A, 14B,
14C
13D
14A
3C
10
5A, 5B,
5C
5A, 5C
6B, 6C,
6E
6B, 6E
7C, 7D
8D, 8E
9C, 9E
10
11A, 11B,
11E
12A, 12B,
12C, 12D,
12E
13A, 13B
14A
7A, 7E
8B, 8C,
8D
9A, 9D
10
11C
12B, 12C,
12D, 12E
13B, 13D
14A, 14B
7B, 7C
8E
9C, 9E
10
11B, 11E
12A, 12C,
12E
13A
14C
25
2015
2016 CALL FOR PAPERS & TUTORIALS
http://rams.org
The Annual Reliability and Maintainability Symposium
January 25 - 28, 2016, Loews Ventana Canyon Resort, Tuscon, Arizona
2016 Theme: “R&M: Critical to Success in a Technology-Reliant World”
The 62nd Annual Reliability & Maintainability Symposium (RAMS®) will be held at the Loews Ventana Canyon Resort in Tucson, Arizona
the week of January 25-28, 2016. The theme for RAMS® 2016 is “R&M: Critical to Success in a Technology Reliant World.” Implementing R&M principles and process across the lifecycle is critical to designing, developing, and supporting reliable and maintainable products.
This year’s theme offers a broad umbrella of opportunities for papers and tutorials that address the overall critically of R&M in the design,
development and support process, and how R&M can be applied on all technology through lessons learned, analyses, modeling and simulation, and training. Equally as important is the discussion of the classical nature of R&M approaches, spanning all technologies and disciplines in the focus to optimize performance. Reliability and Maintainability implementation becomes a competitive advantage throughout
the product life cycle to improve product quality and reduce life cycle cost, given effective application and intentional approaches. We want
to learn more about how you obtain, manage, and effectively leverage R&M in your day-to-day quest to improve your technology and to
bring to market those systems that make our technology driven world a better place.
With this in mind, we invite you to share your theoretical or practical findings as documented by research results, engineering studies, success stories, lessons learned, R&M based analyses and simulations, or R&M discoveries at the RAMS® 2016 in Tucson. Tell us how you are
designing, optimizing, and supporting systems (both hardware and software) by applying reliability and maintainability concepts. Tell us
how you are using reliability and maintainability in other pursuits. We are hoping to continue the understanding that Reliability and Maintainability concepts support overall system success and make all of our lives better.
RAMS® is the premier forum for sharing your experience, knowledge, and roadmaps to success. Make your contribution to the advancement
of the R&M discipline and enjoy participating in the rich exchange of ideas and solutions. We want you to contribute your unique experience to our synergistic symposium sponsored by nine professional societies. Plan to submit your paper or tutorial now.
RAMS® seeks to provide your peers with a mix of papers and tutorials. Papers are the best medium to document advancements in the state-
of-the-art, and those accepted will be published in the Proceedings. A short technical presentation with discussion period (approximately
one-half hour) will be given for each paper at the Symposium. It is the policy of RAMS® to publish all papers presented at RAMS® in IEEE
Xplore. Tutorials provide more fundamental exposure to R&M topics, and their technical depth ranges from introductory through intermediate to advanced. Tutorials are presented in two-hour in-depth sessions at the Symposium. Examples of the most recent written papers and
tutorials are available in the 2015 Proceedings and the 2015 Tutorial Notes.
The process for presenting a paper or tutorial at the RAMS® 2016 begins with your submission of an abstract. Your submittal should
address topics pertinent to Reliability and Maintainability that are relevant to our theme, such as:
Accelerated Life Testing
Business Process Improvement
Design Optimization Using R&M Techniques
Digital Human Modeling & Simulation
Discrete Event Modeling
Economic Models for R&M
Equipment Diagnostics and Prognostics
FMEA
Fault Tree Analysis
Human Reliability
Knowledge Based Training
Life Data Analysis
Physical Reliability Models
R&M Applications in Aerospace
R&M Applications in Health Care
R&M Applications in Infrastructure Management
R&M Applications in Manufacturing
R&M Applications in Service
R&M Applications in Supportability
R&M Management Reliability Modeling
Repairable Systems Modeling
Risk Analysis and Management
Software Reliability Analysis
System Safety
System Safety Analysis Techniques
Warranties
(See RAMS® website or recent Tutorial Notes for other topics)
We look forward to receiving your abstract and seeing you in at the Loews Ventana Canyon Resort in Tucson, Arizona in 2016!
Dan Deans, General Chair, RAMS® 2016
26
ABSTRACT SUBMISSION DEADLINE — Tuesday, April 15, 2015
2016 CALL FOR PAPERS & TUTORIALS
2015
continued
DEADLINE (For Receipt) — Wednesday, April 15, 2015
If you wish to present a paper or tutorial at 2016 RAMS®, now is the
time to begin your preparation. All papers must be new, that is to say,
neither published nor presented at a national or international meeting
prior to the Symposium. Papers presented at local meetings are
acceptable. Tutorials must address key issue areas of broad interest in
reliability and maintainability engineering. To have your paper or tutorial
considered for RAMS® 2016, you must first submit an abstract.
Abstracts must be submitted via rams.org and the abstract
submission process will be available from February 15, 2015, until
April 15, 2015.
To submit an abstract for a paper, an author must provide the
following:
•
a title of no more than 70 characters
•
an abstract (all text—no equations, figures, or tables) of no more
than 1000 words
•
names and contact information for all authors
•
an indication of which author will present the paper (if it is accepted at the Symposium)
•
one or two relevant topic areas for their abstract (from the list on
the previous page of this Call for Papers)
The names of the author(s) should not be included in either the title
or in the abstract. Authors will also be asked to indicate if any authors
are full-time students (to assess qualification for the RAMS® student
paper award), and to which (if any) of the nine RAMS® sponsoring
societies each author belongs. Please note that membership in a RAMS®
sponsoring society is not required for acceptance.
Authors can submit no more than four abstracts for consideration.
Each paper can have no more than four authors (authors cannot be added
to a paper after the April 15, 2015 deadline).
To submit an abstract for a tutorial, an author must provide the following:
•
a title of no more than 70 characters
•
an abstract (all text—no equations, figure, or tables) of no more
than 1000 words
•
names and contact information for all authors
Authors will also be asked to which (if any) of the nine RAMS® sponsoring societies each author belongs. Note that membership in a RAMS®
sponsoring society is not required for acceptance.
Review Procedure for Papers
In May 2015, the RAMS® Program Committee selects a preliminary
program of candidate papers. Selection of candidate papers is based on
innovativeness, technical merit, clarity, and relevance to the Symposium
theme, as demonstrated by the abstract.
Authors will be notified in early June 2015, of their status. Authors of candidate papers are required to submit complete drafts of both the paper and
presentation slides by the end of July 2015. Draft papers shall be submitted without author identification on the paper in order to accommodate
a blind review. The specific requirements for papers and presentation slides
will be communicated to authors in a timely fashion. Draft candidate papers
will be subjected to review by the Program Committee and peer review (authors will be asked to review at least two other candidate or backup papers).
Authors will be given feedback on their draft papers and presentation slides
by the end of August 2015.
Authors of candidate papers must submit their final paper and
presentation slides by the end of September 2015. Final papers will be reviewed by both the Program Committee and the RAMS® Proceedings
Editor. At this time, authors must also complete a RAMS® Copyright Form,
and at least one author of candidate papers must register (at a reduced fee)
for the Symposium.
By submitting an abstract for a paper, the author is accepting the
condition that a candidate or backup paper may be rejected at any time if the
Program Committee determines that the author is failing to
comply with RAMS® deadlines or policies, or if the Program
Committee determines that the content of the paper is not of sufficient
quality to merit publication in the Proceedings. For more information
contact the 2016 Program Chair, David Fernald, [email protected], or the
2016 General Chair, Dan Deans, [email protected]
Review Procedure for Tutorials
The review procedure for tutorials is identical to the review procedure for
papers with the following exceptions:
•
draft tutorials are not subjected to peer review (only Tutorial Committee review)
•
authors of accepted tutorials receive gratis registration for the Symposium
For more information, contact the Tutorials Chair, Caroline Lubert, at
[email protected]
Authors can submit no more than four tutorial abstracts for consideration. No tutorial can have more than two authors (authors cannot be
added to a paper after the April 15, 2015, deadline).
By submitting an abstract for a paper, the author is accepting the
condition that if their paper is ultimately accepted into the Proceedings, at
least one author on the paper will register for the Symposium, attend the
Symposium, and present the paper at the Symposium in reasonably fluent
English.
Upon receipt of your abstract, you will receive a confirmation e-mail
from RAMS®. Therefore, it is critical that authors provide and maintain
a valid e-mail address that can accept e-mail from rams.org. If an author
moves or changes addresses, the author must provide their new contact
information to the RAMS® Program Committee.
By submitting an abstract for a tutorial, the author is accepting the
condition that if their tutorial is ultimately accepted for the Symposium, the
author or co-author will attend the Symposium and deliver the tutorial at the
Symposium in reasonably fluent English.
Note that all correspondence regarding papers and tutorials will be sent
to the e-mail address of the author who submits the abstract.
27
2015
SYMPOSIUM MANAGEMENT COMMITTEE
General Chair
Keith Janasak, Raytheon Company
Vice General Chair
Dan Deans*, Millennium Engineering and Integration Co.
Secretary/Treasurer
Sean Carter, NASA Johnson Space Center
Secretary/Assistant Treasurer
Jan Swider, Aerojet Rocketdyne
Advanced Registration Consultants
Ken Dalton, Retired
Ray Sears, Consultant
Registration Committee
Louis Gullo*, Raytheon Company
Ming Li, U.S. Nuclear Regulatory Commission
Publicity Committee
Julio Pulido*, ReliaSoft Corporation
Ying Shi, NASA Goddard Space Flight Center
Arrangements Committee
Chris Deepak*, Halliburton, Co.
John Turner, Sierra Nevada Corporation
Melvin Downes, ASQ–Electronics & Communications Div.
Om Yadav, North Dakota State University
Program Committee
Suprasad Amari*, Consultant
Dave Fernald, ASQ–Electronics & Communications Div.
Troy Schwartz, Life Cycle Engineering
Wendai Wang, Thoratec Corporation
Steve Glenn, Raytheon Missile Systems
Dmitry Tananko, General Dynamics Land System
Masoud Pourali, University of Maryland
Tongdan Jin, Texas State University
John Klohoker, NASA/Caltech Jet Propulsion Laboratory
Tutorials Committee
Caroline P. Lubert*, James Madison University
John Healy, FCC
Peng Wang, Pratt & Whitney AeroPower
Kellie Schneider, University of Dayton
Vasiliy Krivtsov, Ford Motor Company
* Committee Chair
Other Committees
BOARD OF DIRECTORS
Chair — David Oberhettinger, NASA/Caltech Jet Propulsion
Laboratory (JPL)
David Oberhettinger, LRPC Chair, Technical & Program
Tom Fagan, LRPC, Site Selection
Ray Sears, LRPC, Technical & Program
Alfred Stevens, Human Resources Chair
Dan Deans, Secretary
J.A. Nachlass, Publications Committee
D.F. Barber, Scien-Tech Associates., Exhibits Committee
AIAA
V. W. Wessel, ARES Corporation
ASQ – Electronics & Communications Division
C. W. Plotkin, Ford Motor Company, Retired
ADVISORY BOARD
D. E. Onalfo, IBM Global Services
ASQ – Reliability Division
David W. Coit, Rutgers University
A. M. Stevens, Lockheed-Martin, Retired
Susan L. Hall, Millennium Engineering and Integration Co.
T. Craney, Shell Oil Company
Andrew Monje, Office of the Deputy Assistant Secretary of
IEEE Reliability Society
Defense
T. L. Fagan, TLF Associates
Ali Mosleh, University of California, Los Angeles
R. Jones, Hartford Steam Boiler Inspection & Insurance Co.
Alan H. Phillips, NASA Safety Center
IEST
Randolph G. Phillips, Baker Hughes
D. Aldridge, Raytheon Missile Systems
Pantelis Vassiliou, ReliaSoft Corporation
L. H. Crow, Crow Reliability Resources, Inc.
IIE – Quality Control and Reliability Society
Ed Pohl, U. of Arkansas
O. G. Okogbaa, U. of South Florida & Federal University Wukari, Nigeria
SAE
R. Adib, RMA Consulting Group, LLC
A. Brall, ARES Technical Services
SRE
R. J. Loomis, Jr.. NASA Retired
L. M. Rabon Jr., Retired
SSS
G. Braman, Sikorsky Aircraft Corporation
Henry Hartt, Member At Large
28
2015
Associate Editors
Participating Organizations
Allan Mense, Raytheon Missile Systems
Harry Guo, Reliasoft Corporation
Krishna B. Misra, International Journal of Performability Engineering
Katrina Groth, Sandia National Laboratories
Sameer Vittal, GE Energy
Andre Kleyner, Delphi Electronics & Safety
Soumaya Yacout, École Polytechnique of Montreal
Melinda Hodkiewicz, University of Western Australia
W.-T. Kary Chien, Worldwide Semiconductor Manufacturing Corp.
Yiming Deng, University of Colorado
Anatoly Lisnianski, Israel Electric Corporation
Clifton Lancaster, Hartford Steam Boiler Inspection & Insurance Co.
Ramdev Kanapady, MSCWorks Inc.
Claudio M. Rocco, Universidad Central de Venezuela
Frank Fan, Finning-Canada
Paul Schimmerling, Renault
Warren Naylor, Northrop Grumman
Emmanuel Remy, EDF
C. C. Jane, Ling Tung University
Jean-Rémi Massé, Snecma
Amos Gera, ELTA Systems
Bob Reinertsen, Baker Hughes Incorporated
Marcel Chevalier, Schneider Electric
Gregory Butler, Nordson ASYMTEK
Wilkistar Otieno, University of Wisconsin-Milwaukee
Aerojet Rocketdyne
ARES Corporation
ARES Technical Services
Angel Star, LLC
Baker Hughes
Crow Reliability Resources, Inc
Federal University Wukari
Ford Motor Company
FCC
General Dynamics Land System
Halliburton
Hartford Steam Boiler Inspection and Insurance Co.
IBM Global Services
James Madison University
Life Cycle Engineering
Lockheed Martin Aeronautics Company
Millennium Engineering and Integration Company
Moog
North Dakota State University
NASA Johnson Space Center
NASA/Caltech Jet Propulsion Laboratory
NASA Goddard Space Flight Center
National Aeronautics and Space Administration (NASA)
Operational Test and Evaluation, OSD
Parametric Technology Corporation
Pratt & Whitney AeroPower
Raytheon Company
ReliaSoft Corporation
RMA Consulting Group, LLC
Rutgers University
Scien-Tech Associates, Inc.
Shell Oil Company
Sierra Nevada Corporation
Texas State University
Thoratec Corporation
University of Arkansas
University of California
University of Dayton
University of Maryland
University of South Florida
URS Corporation
U.S. Nuclear Regulatory Commission
Virginia Tech
29
2015
HOTEL PLANS
STIRLING HALL
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OFFICES
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Family Recreation,
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ISLAND COURSE
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Practice
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Range
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Portmarnock
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Wildlife
Preserve
Ro
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R
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Canterbury
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1
Lake Innisbrook
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Dublin
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INDABA
SPA
Copperhead
Pool
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Cypress
Pool
COPPERHEAD COURSE
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Dr
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Inni
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Gate
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Hall
NORTH COURSE
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To
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Belcher
Troon
26
21
Sunningdale
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22
Royal Aberdeen
4
Augusta
Stirling Hall
ad
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Practice Range
Belfast
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r
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Copperhead
Clubhouse
Dornoch
3
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Cov
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Merion
2
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16
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Osprey Clubhouse/ Pine Valley
Guest Registration
Island Clubhouse
7
Peacock
Pool
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eB
Carnoustle
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Portrush
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To
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Road
23
St. Andrews
Welcome
Gate
24
St. Georges
HR/Acct/
Condo Sales
Tournament
Office
2015
Exhibitors Booth Plan
Stirling Ballroom East
University BQR
of
Reliability
Maryland Engineer.
ITEM
Software HCRQ
Ops A La
Carte
SAS
DSIAC
PTC
Controls
and Data
Services
Softrel Cincinnati
Sub-Zero
Satodev
S.A.S.
ReliaSoft
The
Omnicon DfRSoft
Group
of
Minitab Univ.
Arkansas
Stirling Ballroom East
Fulton
Isograph Findings
ALD
WPI
UE
Qualmark Systems Services
31
2015
RAMS, RAMS.org and the RAMS
logo are Registered Trademarks
of the Symposium
32
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