MIMWAND_2015 May19th-rev12atb - final

2nd Midwest Imaging and Microanalysis Workshop at Notre Dame
New Trends in In-situ and High Resolution Electron Microscopy for Nano- technology and Nano-science
Tuesday, May 19th, 2015
Location: McKenna Hall – Room 210-214 (lectures) and Stinson-Remick Hall, Rooms B10, B03 (demo sessions).
Contact for workshop info: Email: [email protected], Ph.: 1 (574) 631-8251
Agenda, May 19, 2015
Registration, Demo sign-up, Poster set-up (McKenna Hall, atrium).
Session 1. Chairs: Sergei Rouvimov and Masaru Kuno (McKenna Hall – Room 210-214)
8:30 - 8:35am
8:35 - 8:40am
8:40 - 9:10am
Welcome: Dean Peter Kilpatrick, University of Notre Dame
Opening: Bradley Smith, NDIIF, University of Notre Dame
Investigating Interfaces and Interfacial Phenomena on the Atomic Scale, David W. McComb, The Ohio State
9:10 - 9:40am
Exploring Lithium-ion battery performance through in situ and operando characterization, Dean Miller, Argonne
National Laboratory
9:40 - 10:10am Advanced Focused Ion Beam Techniques for the Observation, Characterization and Nanoscale Modification and
Manipulation of Advanced Materials: Fun with Ions, John Mansfield, University of Michigan
10:10 - 10:40am Atomic Dynamics in the Supercooled Liquid of Glass-forming Alloys, Paul Voyles, University of Wisconsin
10:40- 11:00am COFFEE BREAK
Session 2. Chairs: Alexander Mukasyan and Jon Camden (McKenna Hall – Room 210-214)
11:00 - 11:30am High Resolution Analysis in 3 dimensions, what are the issues?, Jan Ringnalda, FEI, Inc.
11:30 - 12:00pm Compositional and Thickness Measurements of Thin Films in the Scanning Electron Microscope,
Richard McLaughlin, Oxford Instruments
12:00 - 12:30pm Cathodoluminescence in the STEM, Britt Lassiter, GATAN Inc.
12:30 - 1:00pm Advances in TEM Sample Preparation using DualBeam Systems, Jace McNeil, FEI, Inc.
1:00 - 2:30pm
LUNCH and POSTER SESSION. Chairs: Dallas Rensel & Khachatur Manukyan
(McKenna Hall, Lunch - Lower Level Dining Area – Posters Atrium 2nd Floor)
Session 3. Chairs: Mathew Leevy and Bradley Smith (McKenna Hall – room 210-214)
2:30 - 2:45pm
2:45 - 3:00pm
3:00 - 3:30pm
3:30 - 3:50pm
3:50 - 4:10pm
4:10 - 4:40pm
6:00 pm
Contrast-Enhanced X-ray Detection of Microcalcifications using Targeted Gold Nanoparticles, Lisa Cole,
University of Notre Dame
Elucidating Nanostructure-Property Relationships for Mixed Mosaic Membranes Prepared by Layer by Layer
Assembly Using Microscopy, W. Phillip, University of Notre Dame
Applications of low-loss EELS to imaging energy transfer from plasmonic nanoparticles into semiconductors by
Jon Camden, University of Notre Dame
In-situ TEM on catalysts at atmospheric pressure with a novel gas cell, Shuyi Zhang, University of Michigan
Electron Microscopy the 3rd Dimension, Mark Kelsey, Bruker Inc.
Characterization of multi-component materials stacks: linking electrical and structural materials properties,
Gennadi Bersuker, Sematech
Closing of the workshop
DINNER (speakers) / Business Meeting - The Mark Dine & Tap
1234 Eddy Street, Suite 111, South Bend, IN 46617
Phone: 574-204-2767
May 20th, 2014
9:00am - 5:00pm Vendor’s tutorials and demo sessions (Stinson-Remick Hall, Rooms B03 and B10)
Jace McNeil: Helios FIB/SEM Demonstrator, Jan Ringnalda: FEI Titan 80-300 TEM Demonstrator
Note: the detailed schedule will be provided at the registration.
For additional workshop information and campus map visit: http://ndiif.nd.edu
Sponsors: FEI, Protochips, Inc., Oxford Instruments, GATAN, University of Notre Dame (Office of Research, College of
Engineering, College of Science, NDIIF, Department of Electrical Engineering, CBE Department, ND Energy Center,
ND Nano Center)